An inter-comparison program (round-robin-test) aimed at the establishment of a standard test method for the bending strain effect on the critical current in Ag alloy-sheathed Bi-2223 tapes was implemented with participation of 12 laboratories around the world. Samples were bent at room temperature using bending devices that were specially designed for this RRT. The critical current was measured at 77 K and in the self-field. After critical current measurement of an unbent sample, bending of the sample and subsequent critical current measurements were done from 0.2% to 1.0% in 0.2% steps of strains on a single sample. Reported data from participants showed that the critical current values start to decrease from 0.4% strain and continue to decrease to 1.0% strain. Moreover, the data scatter starts to increase stepwise at 0.4% strain, being correspondent to the variation in the critical current values with bending strain, and it continues to increase gradually to 1.0% strain. The coefficient of variation values are 2.5%, 5.1% and 6.4% for 0%, 0.4% and 1.0% bending strain, respectively. Results were also compared in terms of the irreversible bending strain. Possible sources of error are discussed.
- Critical current
- Bending strain
- Bi-2223/Ag tape
- Measurement method
Kuroda, T., Itoh, K., Katagiri, K., Goldacker, W., ten Haken, B., & Weijers, H. W. (2005). Bending strain effect on critical current of Bi-2223 superconductor tapes-report of international round-robin-test. Physica C, 425(3-4), 111-120. https://doi.org/10.1016/j.physc.2005.06.018