Best-first generation of diagnoses in technical systems

R.R. Bakker, P.C.A. van den Bempt, D.C. van Soest

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    13 Citations (Scopus)
    Original languageUndefined
    Title of host publication7th DKBS workshop
    Place of PublicationAberystwyth, Wales
    Pages1-8
    Number of pages8
    Publication statusPublished - 1 Sep 1990

    Keywords

    • METIS-119744

    Cite this

    Bakker, R. R., van den Bempt, P. C. A., & van Soest, D. C. (1990). Best-first generation of diagnoses in technical systems. In 7th DKBS workshop (pp. 1-8). Aberystwyth, Wales.