Best-first generation of diagnoses in technical systems

R.R. Bakker, P.C.A. van den Bempt, D.C. van Soest

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    13 Citations (Scopus)
    Original languageUndefined
    Title of host publication7th DKBS workshop
    Place of PublicationAberystwyth, Wales
    Pages1-8
    Number of pages8
    Publication statusPublished - 1 Sep 1990

    Keywords

    • METIS-119744

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