Skip to main navigation Skip to search Skip to main content

Best-first generation of diagnoses in technical systems

  • R.R. Bakker
  • , P.C.A. van den Bempt
  • , D.C. van Soest

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publication7th DKBS workshop
    Place of PublicationAberystwyth, Wales
    Pages1-8
    Number of pages8
    Publication statusPublished - 1 Sept 1990

    Keywords

    • METIS-119744

    Cite this