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Best-first generation of diagnoses in technical systems

  • R.R. Bakker
  • , P.C.A. van den Bempt
  • , D.C. van Soest

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    14   Link opens in a new tab Citations (Scopus)
    Original languageUndefined
    Title of host publication7th DKBS workshop
    Place of PublicationAberystwyth, Wales
    Pages1-8
    Number of pages8
    Publication statusPublished - 1 Sept 1990

    Keywords

    • METIS-119744

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