Abstract
In recent years the protection of biometric data has gained increased interest from the scientific community. Methods such as the helper data system, fuzzy extractors, fuzzy vault and cancellable biometrics have been proposed for protecting biometric data. Most of these methods use cryptographic primitives and require a binary representation from the real-valued biometric data. Hence, the similarity of biometric samples is measured in terms of the Hamming distance between the binary vector obtained at the enrolment and verification phase. The number of errors depends on the expected error probability Pe of each bit between two biometric samples of the same subject. In this paper we introduce a framework for analytically estimating Pe under the assumption that the within-and between-class distribution can be modeled by a Gaussian distribution. We present the analytic expression of Pe as a function of the number of samples used at the enrolment (Ne) and verification (Nv) phases. The analytic expressions are validated using the FRGC v2 and FVC2000 biometric databases.
Original language | English |
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Title of host publication | 2nd IEEE International Conference on Biometrics: Theory, Applications and Systems, BTAS 2008 |
Place of Publication | Los Alamitos |
Publisher | IEEE |
Pages | 1-6 |
Number of pages | 6 |
ISBN (Print) | 978-1-4244-2729-1 |
DOIs | |
Publication status | Published - 29 Sep 2008 |
Event | 2nd IEEE International Conference on Biometrics: Theory Applications and Systems, BTAS 2008 - Washington, United States Duration: 29 Sep 2008 → 1 Oct 2008 Conference number: 2 http://www.cse.nd.edu/BTAS_08/ |
Conference
Conference | 2nd IEEE International Conference on Biometrics: Theory Applications and Systems, BTAS 2008 |
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Abbreviated title | BTAS |
Country/Territory | United States |
City | Washington |
Period | 29/09/08 → 1/10/08 |
Internet address |
Keywords
- SCS-Safety
- CR-D.4.6
- METIS-256133
- EWI-14616
- IR-65219
- DB-SDM: SECURE DATA MANAGEMENT