Abstract
This paper is concerned with mapping the characteristics of blistering induced on Mo/Si multilayers as a result of irradiation by hydrogen species generated in a thermal capillary cracker. The nature and extent of the damage observed is dependent on exposure conditions such as the sample temperature, the hydrogen isotope used and the total fluence. Increasing the sample temperature leads to fewer but larger blisters. When D2 is used as the working gas, blisters are ~5 times smaller in diameter than in the case of H2 exposure, but more blisters are formed. Increasing the gas flow induces more and bigger blisters andblisters were observed to develop in two distinct size distributions.
Original language | English |
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Title of host publication | SPIE Optics + Optoelectronics 2011 |
Editors | A.S. Kuznetsov |
Publisher | SPIE |
Number of pages | 6 |
DOIs | |
Publication status | Published - 18 Apr 2011 |
Event | SPIE Optics + Optoelectronics 2011 - Prague Congress Centre, Prague, Czech Republic Duration: 18 Apr 2011 → 20 Apr 2011 https://spie.org/conferences-and-exhibitions/past-conferences-and-exhibitions/optics-and-optoelectronics-2011 |
Publication series
Name | Proceedings of SPIE |
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Publisher | SPIE |
Volume | 8077 |
ISSN (Print) | 0277-786X |
Conference
Conference | SPIE Optics + Optoelectronics 2011 |
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Country/Territory | Czech Republic |
City | Prague |
Period | 18/04/11 → 20/04/11 |
Internet address |
Keywords
- METIS-283336