@inproceedings{3d4c4c245c86407387c94ea6ef685cb0,
title = "BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits",
abstract = "Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought to be high for successful diagnosis of analogue circuits. With this knowledge in mind, a responsibility was undertaken to choose a popular diagnostic method and define a systematic procedure that binds together the knowledge of a product from a design, test and diagnostic engineer. A set of software utilities was developed that assists in automating these procedures and in collecting appropriate data for effective diagnosis of analogue circuits. This paper will discuss the chosen methodology for diagnosis and the associated procedures for block-level diagnosis of analogue electronic circuits in detail. The paper is concluded with an illustration of the methodology and the related procedures of an industrial automotive voltage regulator circuit as a representative example.",
keywords = "METIS-271160, IR-74978, CAES-TDT: Testable Design and Test, analogue electronic circuits, EWI-18939, Bayesian diagnosis",
author = "Shaji Krishnan and Shaji Krishnan and Kerkhoff, {Hans G.} and Doornbosch, {Klaas D.} and Rudi Brand",
year = "2010",
month = mar,
day = "8",
language = "Undefined",
isbn = "978-1-4244-7054-9",
publisher = "IEEE",
pages = "1767--1772",
booktitle = "Design, Automation & Test in Europe Conference & Exhibition, DATE 2010",
address = "United States",
note = "null ; Conference date: 08-03-2010 Through 12-03-2010",
}