BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits

Shaji Krishnan, Shaji Krishnan, Hans G. Kerkhoff, Klaas D. Doornbosch, Rudi Brand

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    Abstract

    Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought to be high for successful diagnosis of analogue circuits. With this knowledge in mind, a responsibility was undertaken to choose a popular diagnostic method and define a systematic procedure that binds together the knowledge of a product from a design, test and diagnostic engineer. A set of software utilities was developed that assists in automating these procedures and in collecting appropriate data for effective diagnosis of analogue circuits. This paper will discuss the chosen methodology for diagnosis and the associated procedures for block-level diagnosis of analogue electronic circuits in detail. The paper is concluded with an illustration of the methodology and the related procedures of an industrial automotive voltage regulator circuit as a representative example.
    Original languageUndefined
    Title of host publicationDesign, Automation & Test in Europe Conference & Exhibition, DATE 2010
    Place of PublicationNew York
    PublisherIEEE
    Pages1767-1772
    Number of pages6
    ISBN (Print)978-1-4244-7054-9
    Publication statusPublished - 8 Mar 2010
    Event2010 Design, Automation & Test in Europe Conference & Exhibition, DATE 2010 - Dresden, Germany
    Duration: 8 Mar 201012 Mar 2010

    Publication series

    Name
    PublisherIEEE
    ISSN (Print)1530-1591

    Conference

    Conference2010 Design, Automation & Test in Europe Conference & Exhibition, DATE 2010
    Abbreviated titleDATE
    CountryGermany
    CityDresden
    Period8/03/1012/03/10

    Keywords

    • METIS-271160
    • IR-74978
    • CAES-TDT: Testable Design and Test
    • analogue electronic circuits
    • EWI-18939
    • Bayesian diagnosis

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