SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.
|Publisher||IEEE Circuits & Systems Society|
|Conference||2011 International SoC Design Conference, ISOCC 2011|
|Country/Territory||Korea, Republic of|
|Period||17/11/11 → 18/11/11|
- CAES-TDT: Testable Design and Test
- Gain boosting