Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs

J. Wan, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    6 Citations (Scopus)


    SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.
    Original languageUndefined
    Title of host publication2011 International SoC Design Conference, ISOCC 2011
    Place of PublicationSeoul
    PublisherIEEE Circuits & Systems Society
    Number of pages4
    ISBN (Print)978-1-4577-0711-7
    Publication statusPublished - 28 Aug 2011
    Event2011 International SoC Design Conference, ISOCC 2011 - Kyung Hee University, Seoul, Korea, Republic of
    Duration: 17 Nov 201118 Nov 2011

    Publication series

    PublisherIEEE Circuits & Systems Society


    Conference2011 International SoC Design Conference, ISOCC 2011
    Abbreviated titleISOCC
    Country/TerritoryKorea, Republic of


    • IR-79174
    • METIS-284923
    • NBTI
    • EWI-20818
    • Dependability
    • Opamp
    • CAES-TDT: Testable Design and Test
    • Gain boosting

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