Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs

J. Wan; Hans G. Kerkhoff

doi:10.1109/ISOCC.2011.6138768

Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs

J. Wan, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

Abstract

SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.

Original language	Undefined
Title of host publication	2011 International SoC Design Conference, ISOCC 2011
Place of Publication	Seoul
Publisher	IEEE Circuits & Systems Society
Pages	294-297
Number of pages	4
ISBN (Print)	978-1-4577-0711-7
DOIs	https://doi.org/10.1109/ISOCC.2011.6138768
Publication status	Published - 28 Aug 2011
Event	2011 International SoC Design Conference, ISOCC 2011 - Kyung Hee University, Seoul, Korea, Republic of Duration: 17 Nov 2011 → 18 Nov 2011

Publication series

Name
Publisher	IEEE Circuits & Systems Society

Conference

Conference	2011 International SoC Design Conference, ISOCC 2011
Abbreviated title	ISOCC
Country	Korea, Republic of
City	Seoul
Period	17/11/11 → 18/11/11

Keywords

IR-79174
METIS-284923
NBTI
EWI-20818
Dependability
Opamp
CAES-TDT: Testable Design and Test
Gain boosting

Access to Document

10.1109/ISOCC.2011.6138768

http://eprints.eemcs.utwente.nl/secure2/20818/01/S15-4.pdf

Cite this

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title = "Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs",

abstract = "SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.",

keywords = "IR-79174, METIS-284923, NBTI, EWI-20818, Dependability, Opamp, CAES-TDT: Testable Design and Test, Gain boosting",

author = "J. Wan and Kerkhoff, {Hans G.}",

note = "eemcs-eprint-20818 ; null ; Conference date: 17-11-2011 Through 18-11-2011",

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N2 - SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.

AB - SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.

KW - IR-79174

KW - METIS-284923

KW - NBTI

KW - EWI-20818

KW - Dependability

KW - Opamp

KW - CAES-TDT: Testable Design and Test

KW - Gain boosting

U2 - 10.1109/ISOCC.2011.6138768

DO - 10.1109/ISOCC.2011.6138768

M3 - Conference contribution

SN - 978-1-4577-0711-7

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EP - 297

BT - 2011 International SoC Design Conference, ISOCC 2011

PB - IEEE Circuits & Systems Society

CY - Seoul

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