Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs

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    Abstract

    SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.
    Original languageUndefined
    Title of host publication2011 International SoC Design Conference, ISOCC 2011
    Place of PublicationSeoul
    PublisherIEEE Circuits & Systems Society
    Pages294-297
    Number of pages4
    ISBN (Print)978-1-4577-0711-7
    DOIs
    Publication statusPublished - 28 Aug 2011
    Event2011 International SoC Design Conference, ISOCC 2011 - Kyung Hee University, Seoul, Korea, Republic of
    Duration: 17 Nov 201118 Nov 2011

    Publication series

    Name
    PublisherIEEE Circuits & Systems Society

    Conference

    Conference2011 International SoC Design Conference, ISOCC 2011
    Abbreviated titleISOCC
    CountryKorea, Republic of
    CitySeoul
    Period17/11/1118/11/11

    Keywords

    • IR-79174
    • METIS-284923
    • NBTI
    • EWI-20818
    • Dependability
    • Opamp
    • CAES-TDT: Testable Design and Test
    • Gain boosting

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