@inproceedings{5c83bfaa54784d0e9cf6348d9473d01f,
title = "Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs",
abstract = "SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.",
keywords = "IR-79174, METIS-284923, NBTI, EWI-20818, Dependability, Opamp, CAES-TDT: Testable Design and Test, Gain boosting",
author = "J. Wan and Kerkhoff, {Hans G.}",
note = "eemcs-eprint-20818 ; null ; Conference date: 17-11-2011 Through 18-11-2011",
year = "2011",
month = aug,
day = "28",
doi = "10.1109/ISOCC.2011.6138768",
language = "Undefined",
isbn = "978-1-4577-0711-7",
publisher = "IEEE Circuits & Systems Society",
pages = "294--297",
booktitle = "2011 International SoC Design Conference, ISOCC 2011",
}