Boundary-Scan Testing for Mixed-Signal MCMs

Hans G. Kerkhoff, G. Boom, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings VLSI'97 Chapman & Hall
    Place of PublicationGramado Brasil
    Number of pages11
    Publication statusPublished - 1 Aug 1997


    • METIS-112949

    Cite this

    Kerkhoff, H. G., Boom, G., & Speek, H. (1997). Boundary-Scan Testing for Mixed-Signal MCMs. In Proceedings VLSI'97 Chapman & Hall (pp. 515-525). Gramado Brasil.