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Boundary-Scan Testing for Mixed-Signal MCMs

  • Hans G. Kerkhoff
  • , G. Boom
  • , H. Speek

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Original languageUndefined
    Title of host publicationProceedings VLSI'97 Chapman & Hall
    Place of PublicationGramado Brasil
    Pages515-525
    Number of pages11
    Publication statusPublished - 1 Aug 1997

    Keywords

    • METIS-112949

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