Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications

Oscar J. Kuiken; Xiao  Zhang; Hans G. Kerkhoff

doi:10.1109/DFT.2008.24

Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications

Oscar J. Kuiken, Xiao Zhang, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

9 Citations (Scopus)

30 Downloads (Pure)

Abstract

Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capability on a single chip as well as flexibility to adapt to new algorithms. A reconfigurable IC with many processing tiles based on the Network-on-Chip architecture is considered ideal for such applications as it balances efficiency and flexibility. Due to the highly regular arrangement of the processing tiles connected by the communication network, it is possible to adopt new Design-for-X strategies to improve the dependability of the reconfigurable IC. The communication network can be reused as a test-access mechanism. On-chip deterministic test pattern generators can multicast test-vectors through the network to the cores under test and test responses from multiple cores can be collected and analyzed by a test result evaluator. The faulty core, or functional parts of it, will be labeled and isolated from the whole system by re-mapping the computing resources and thus improve the dependability of the whole system.

Original language	English
Title of host publication	The 23rd IEEE IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, DFT 2008
Place of Publication	Los Alamitos, CA
Publisher	IEEE
Pages	45-53
Number of pages	9
ISBN (Print)	978-0-7695-3365-0
DOIs	https://doi.org/10.1109/DFT.2008.24
Publication status	Published - 1 Oct 2008
Event	23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2008 - Hyatt Regency Cambridge, Cambridge, United States Duration: 1 Oct 2008 → 3 Oct 2008 Conference number: 23

Publication series

Name	IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
Publisher	IEEE Computer Society Press
Number	23
Volume	2008
ISSN (Print)	1550-5774
ISSN (Electronic)	2377-7966

Conference

Conference	23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2008
Abbreviated title	DFT
Country/Territory	United States
City	Cambridge
Period	1/10/08 → 3/10/08

Keywords

EC Grant Agreement nr.: FP7/215881
n/a OA procedure

Access to Document

10.1109/DFT.2008.24

Cite this

Kuiken, O. J., Zhang, X., & Kerkhoff, H. G. (2008). Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications. In The 23rd IEEE IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, DFT 2008 (pp. 45-53). (IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems; Vol. 2008, No. 23). IEEE. https://doi.org/10.1109/DFT.2008.24

Kuiken, Oscar J. ; Zhang, Xiao ; Kerkhoff, Hans G. / Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications. The 23rd IEEE IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, DFT 2008. Los Alamitos, CA : IEEE, 2008. pp. 45-53 (IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems; 23).

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abstract = "Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capability on a single chip as well as flexibility to adapt to new algorithms. A reconfigurable IC with many processing tiles based on the Network-on-Chip architecture is considered ideal for such applications as it balances efficiency and flexibility. Due to the highly regular arrangement of the processing tiles connected by the communication network, it is possible to adopt new Design-for-X strategies to improve the dependability of the reconfigurable IC. The communication network can be reused as a test-access mechanism. On-chip deterministic test pattern generators can multicast test-vectors through the network to the cores under test and test responses from multiple cores can be collected and analyzed by a test result evaluator. The faulty core, or functional parts of it, will be labeled and isolated from the whole system by re-mapping the computing resources and thus improve the dependability of the whole system.",

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Kuiken, OJ, Zhang, X & Kerkhoff, HG 2008, Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications. in The 23rd IEEE IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, DFT 2008. IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, no. 23, vol. 2008, IEEE, Los Alamitos, CA, pp. 45-53, 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2008, Cambridge, Massachusetts, United States, 1/10/08. https://doi.org/10.1109/DFT.2008.24

Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications. / Kuiken, Oscar J.; Zhang, Xiao ; Kerkhoff, Hans G.
The 23rd IEEE IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, DFT 2008. Los Alamitos, CA: IEEE, 2008. p. 45-53 (IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems; Vol. 2008, No. 23).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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N2 - Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capability on a single chip as well as flexibility to adapt to new algorithms. A reconfigurable IC with many processing tiles based on the Network-on-Chip architecture is considered ideal for such applications as it balances efficiency and flexibility. Due to the highly regular arrangement of the processing tiles connected by the communication network, it is possible to adopt new Design-for-X strategies to improve the dependability of the reconfigurable IC. The communication network can be reused as a test-access mechanism. On-chip deterministic test pattern generators can multicast test-vectors through the network to the cores under test and test responses from multiple cores can be collected and analyzed by a test result evaluator. The faulty core, or functional parts of it, will be labeled and isolated from the whole system by re-mapping the computing resources and thus improve the dependability of the whole system.

AB - Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capability on a single chip as well as flexibility to adapt to new algorithms. A reconfigurable IC with many processing tiles based on the Network-on-Chip architecture is considered ideal for such applications as it balances efficiency and flexibility. Due to the highly regular arrangement of the processing tiles connected by the communication network, it is possible to adopt new Design-for-X strategies to improve the dependability of the reconfigurable IC. The communication network can be reused as a test-access mechanism. On-chip deterministic test pattern generators can multicast test-vectors through the network to the cores under test and test responses from multiple cores can be collected and analyzed by a test result evaluator. The faulty core, or functional parts of it, will be labeled and isolated from the whole system by re-mapping the computing resources and thus improve the dependability of the whole system.

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BT - The 23rd IEEE IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, DFT 2008

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Kuiken OJ, Zhang X, Kerkhoff HG. Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications. In The 23rd IEEE IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, DFT 2008. Los Alamitos, CA: IEEE. 2008. p. 45-53. (IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems; 23). doi: 10.1109/DFT.2008.24

Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications

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Keywords

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