Built-In Self-Test Methodology for A/D Converters

R. de Vries, T. Zwemstra, E.M.J.G. Bruis, Paulus P.L. Regtien

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

A (partial) Built-in Self-Test (BIST) methodology is proposed for analog to digital (A/D) converters. In this methodology the number of bits of the A/D converter that needs to be monitored externally in a test is reduced. This reduction depends, among other things, on the frequency of the applied test signal. At low test signal frequencies only the least significant bit (LSB) needs to be monitored and a "full" BIST becomes feasible. An analysis is made of the trade-off between the size of the on-chip test circuitry and the accuracy of this BIST technique
Original languageUndefined
Title of host publicationProceedings of the European Design & Test Conference ED&TC97
Place of PublicationParis, France
Pages353-358
DOIs
Publication statusPublished - 17 Mar 1997

Keywords

  • IR-16573
  • METIS-113458

Cite this

de Vries, R., Zwemstra, T., Bruis, E. M. J. G., & Regtien, P. P. L. (1997). Built-In Self-Test Methodology for A/D Converters. In Proceedings of the European Design & Test Conference ED&TC97 (pp. 353-358). Paris, France. https://doi.org/10.1109/EDTC.1997.582382
de Vries, R. ; Zwemstra, T. ; Bruis, E.M.J.G. ; Regtien, Paulus P.L. / Built-In Self-Test Methodology for A/D Converters. Proceedings of the European Design & Test Conference ED&TC97. Paris, France, 1997. pp. 353-358
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de Vries, R, Zwemstra, T, Bruis, EMJG & Regtien, PPL 1997, Built-In Self-Test Methodology for A/D Converters. in Proceedings of the European Design & Test Conference ED&TC97. Paris, France, pp. 353-358. https://doi.org/10.1109/EDTC.1997.582382

Built-In Self-Test Methodology for A/D Converters. / de Vries, R.; Zwemstra, T.; Bruis, E.M.J.G.; Regtien, Paulus P.L.

Proceedings of the European Design & Test Conference ED&TC97. Paris, France, 1997. p. 353-358.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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de Vries R, Zwemstra T, Bruis EMJG, Regtien PPL. Built-In Self-Test Methodology for A/D Converters. In Proceedings of the European Design & Test Conference ED&TC97. Paris, France. 1997. p. 353-358 https://doi.org/10.1109/EDTC.1997.582382