Built-In Self-Test Methodology for A/D Converters

R. de Vries, T. Zwemstra, E.M.J.G. Bruis, P.P.L. Regtien

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    37 Citations (Scopus)
    161 Downloads (Pure)


    A (partial) Built-in Self-Test (BIST) methodology is proposed for analog to digital (A/D) converters. In this methodology the number of bits of the A/D converter that needs to be monitored externally in a test is reduced. This reduction depends, among other things, on the frequency of the applied test signal. At low test signal frequencies only the least significant bit (LSB) needs to be monitored and a "full" BIST becomes feasible. An analysis is made of the trade-off between the size of the on-chip test circuitry and the accuracy of this BIST technique
    Original languageEnglish
    Title of host publicationProceedings of the European Design & Test Conference ED&TC97
    Place of PublicationParis, France
    Publication statusPublished - 17 Mar 1997
    EventEuropean Design & Test Conference, ED&TC 1997
    : ED&TC
    - Paris, France
    Duration: 17 Mar 199720 Mar 1997


    ConferenceEuropean Design & Test Conference, ED&TC 1997


    Dive into the research topics of 'Built-In Self-Test Methodology for A/D Converters'. Together they form a unique fingerprint.

    Cite this