Bulk-micromachined test structure for fast and reliable determination of the lateral thermal conductivity of thin films

Luigi La Spina*, Alexander W. van Herwaarden, Hugo Schellevis, Wim H.A. Wien, Nebojša Nenadović, Lis K. Nanver

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

20 Citations (Scopus)

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Engineering & Materials Science