Abstract
N‐channel field effect transistors with excellent device characteristics have been fabricated by utilizing C60 as the active element. Measurements on C60 thin films in ultrahigh vacuum show on‐off ratios as high as 106 and field effect mobilities up to 0.08 cm2/V s.
Original language | English |
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Pages (from-to) | 121-123 |
Journal | Applied physics letters |
Volume | 67 |
Issue number | 1 |
DOIs | |
Publication status | Published - May 1995 |
Externally published | Yes |