Calibration and evaluation of scanning-force-microscopy probes

S.S. Sheiko, M. Möller, E.M.C.M. Reuvekamp, H.W. Zandbergen

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144 Citations (Scopus)

Abstract

It is demonstrated that a stepped (305) surface of a SrTiO3 crystal can be used routinely to evaluate the probing profile of scanning-force-microscopy probes. This provides a means to select optimal surface probes, and to evaluate possible image distortions within the range of the atomic and nanometer scale. The scope and limitations of the resolution of structural defects are discussed as a criterion for a true atomic resolution.
Original languageEnglish
Pages (from-to)5675-5678
Number of pages8
JournalPhysical Review B (Condensed Matter)
Volume48
Issue number8
DOIs
Publication statusPublished - 1993

Keywords

  • IR-103952
  • METIS-106150

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  • Cite this

    Sheiko, S. S., Möller, M., Reuvekamp, E. M. C. M., & Zandbergen, H. W. (1993). Calibration and evaluation of scanning-force-microscopy probes. Physical Review B (Condensed Matter), 48(8), 5675-5678. https://doi.org/10.1103/PhysRevB.48.5675