Canticlever - Planar fabrication of probes for magnetic imaging

A.G. van den Bos

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    192 Downloads (Pure)

    Abstract

    Magnetic force microscopy (MFM) is a scanning probe technique that is used to generate a high–resolution image of stray fields above a magnetic thin film, with very little sample preparation. This makes the MFM the instrument of choice for the analysis of bit patterns in hard disks. The tremendous increase in data density of magnetic storage systems has pushed the bit size down into the nanometer range, close to the maximum resolution of current MFM’s. This resolution, which is currently limited by the geometry of the magnetic tip, has to be improved, or the hard disk research community will loose a very powerful imaging technique. In this thesis a new probe for magnetic microscopy and recording, called the CantiClever, is presented. This probe is designed to address the issue of the tip geometry of conventional MFM tips. The new probe also allows for integration of other sensors besides an MFM tip with relative ease due to its planar fabrication process.
    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Lodder, J.C., Supervisor
    • Abelmann, Leon , Advisor
    Thesis sponsors
    Award date1 Nov 2003
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-365-1988-8
    Publication statusPublished - Nov 2003

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • METIS-212776
    • IR-41554
    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • TST-MFM: Magnetic Force Microscope
    • TST-uSPAM: micro Scanning Probe Array Memory
    • EWI-5333

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