Canticlever - Planar fabrication of probes for magnetic imaging

A.G. van den Bos

    Abstract

    Magnetic force microscopy (MFM) is a scanning probe technique that is used to generate a high–resolution image of stray fields above a magnetic thin film, with very little sample preparation. This makes the MFM the instrument of choice for the analysis of bit patterns in hard disks. The tremendous increase in data density of magnetic storage systems has pushed the bit size down into the nanometer range, close to the maximum resolution of current MFM’s. This resolution, which is currently limited by the geometry of the magnetic tip, has to be improved, or the hard disk research community will loose a very powerful imaging technique. In this thesis a new probe for magnetic microscopy and recording, called the CantiClever, is presented. This probe is designed to address the issue of the tip geometry of conventional MFM tips. The new probe also allows for integration of other sensors besides an MFM tip with relative ease due to its planar fabrication process.
    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Supervisor
    • Abelmann, Leon , Advisor
    Sponsors
    Date of Award1 Nov 2003
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-365-1988-8
    StatePublished - Nov 2003

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    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • METIS-212776
    • IR-41554
    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • TST-MFM: Magnetic Force Microscope
    • TST-uSPAM: micro Scanning Probe Array Memory
    • EWI-5333

    Cite this

    van den Bos, A. G. (2003). Canticlever - Planar fabrication of probes for magnetic imaging Enschede: Twente University Press (TUP)
    van den Bos, A.G.. / Canticlever - Planar fabrication of probes for magnetic imaging. Enschede : Twente University Press (TUP), 2003. 166 p.
    @misc{9f34e00867d14416bf74ce541bec146a,
    title = "Canticlever - Planar fabrication of probes for magnetic imaging",
    abstract = "Magnetic force microscopy (MFM) is a scanning probe technique that is used to generate a high–resolution image of stray fields above a magnetic thin film, with very little sample preparation. This makes the MFM the instrument of choice for the analysis of bit patterns in hard disks. The tremendous increase in data density of magnetic storage systems has pushed the bit size down into the nanometer range, close to the maximum resolution of current MFM’s. This resolution, which is currently limited by the geometry of the magnetic tip, has to be improved, or the hard disk research community will loose a very powerful imaging technique. In this thesis a new probe for magnetic microscopy and recording, called the CantiClever, is presented. This probe is designed to address the issue of the tip geometry of conventional MFM tips. The new probe also allows for integration of other sensors besides an MFM tip with relative ease due to its planar fabrication process.",
    keywords = "SMI-TST: From 2006 in EWI-TST, METIS-212776, IR-41554, SMI-EXP: EXPERIMENTAL TECHNIQUES, TST-MFM: Magnetic Force Microscope, TST-uSPAM: micro Scanning Probe Array Memory, EWI-5333",
    author = "{van den Bos}, A.G.",
    note = "Imported from SMI Theses",
    year = "2003",
    month = "11",
    isbn = "90-365-1988-8",
    publisher = "Twente University Press (TUP)",
    address = "Netherlands",
    school = "University of Twente",

    }

    van den Bos, AG 2003, 'Canticlever - Planar fabrication of probes for magnetic imaging', University of Twente, Enschede.

    Canticlever - Planar fabrication of probes for magnetic imaging. / van den Bos, A.G.

    Enschede : Twente University Press (TUP), 2003. 166 p.

    Research output: ScientificPhD Thesis - Research UT, graduation UT

    TY - THES

    T1 - Canticlever - Planar fabrication of probes for magnetic imaging

    AU - van den Bos,A.G.

    N1 - Imported from SMI Theses

    PY - 2003/11

    Y1 - 2003/11

    N2 - Magnetic force microscopy (MFM) is a scanning probe technique that is used to generate a high–resolution image of stray fields above a magnetic thin film, with very little sample preparation. This makes the MFM the instrument of choice for the analysis of bit patterns in hard disks. The tremendous increase in data density of magnetic storage systems has pushed the bit size down into the nanometer range, close to the maximum resolution of current MFM’s. This resolution, which is currently limited by the geometry of the magnetic tip, has to be improved, or the hard disk research community will loose a very powerful imaging technique. In this thesis a new probe for magnetic microscopy and recording, called the CantiClever, is presented. This probe is designed to address the issue of the tip geometry of conventional MFM tips. The new probe also allows for integration of other sensors besides an MFM tip with relative ease due to its planar fabrication process.

    AB - Magnetic force microscopy (MFM) is a scanning probe technique that is used to generate a high–resolution image of stray fields above a magnetic thin film, with very little sample preparation. This makes the MFM the instrument of choice for the analysis of bit patterns in hard disks. The tremendous increase in data density of magnetic storage systems has pushed the bit size down into the nanometer range, close to the maximum resolution of current MFM’s. This resolution, which is currently limited by the geometry of the magnetic tip, has to be improved, or the hard disk research community will loose a very powerful imaging technique. In this thesis a new probe for magnetic microscopy and recording, called the CantiClever, is presented. This probe is designed to address the issue of the tip geometry of conventional MFM tips. The new probe also allows for integration of other sensors besides an MFM tip with relative ease due to its planar fabrication process.

    KW - SMI-TST: From 2006 in EWI-TST

    KW - METIS-212776

    KW - IR-41554

    KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

    KW - TST-MFM: Magnetic Force Microscope

    KW - TST-uSPAM: micro Scanning Probe Array Memory

    KW - EWI-5333

    M3 - PhD Thesis - Research UT, graduation UT

    SN - 90-365-1988-8

    PB - Twente University Press (TUP)

    ER -

    van den Bos AG. Canticlever - Planar fabrication of probes for magnetic imaging. Enschede: Twente University Press (TUP), 2003. 166 p.