Capacitance measurements on grain boundaries in Y1-xCaxBa2Cu3O7-δ

J.H.T. Ransley, P.F. McBrien, G. Burnell, E.J. Tarte, J.E. Evetts, R.R. Schulz, C.W. Schneider, A. Schmehl, H. Bielefeldt, H. Hilgenkamp, J. Mannhart

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    Abstract

    The capacitance of 24°[001] tilt calcium doped Y1−xCaxBa2Cu3O7−δ grain boundaries has been measured for thin films with x in the range 0.0–0.3. The capacitance was determined from the hysteresis in the I−V characteristic. By measuring the capacitance as a function of the voltage across the junctions it was possible to observe the contribution of both parasitic substrate capacitance and heating to the hysteresis. These effects enable the determination of the intrinsic capacitance of the grain boundaries. The effect of thermal noise on the measurement is also assessed, and found to be much less than the observed changes in the capacitance. The capacitance is found to increase as the calcium doping increases: from 0.2 Fm−2 for x=0.0 to a maximum of 1.2 Fm−2 for x=0.3. The changes in the capacitance per unit area are observed to be inversely proportional to the corresponding changes in the resistance area product.
    Original languageEnglish
    Article number104502
    Number of pages11
    JournalPhysical Review B (Condensed Matter and Materials Physics)
    Volume70
    DOIs
    Publication statusPublished - 2004

    Fingerprint

    Capacitance measurement
    Grain boundaries
    Capacitance
    grain boundaries
    capacitance
    Hysteresis
    calcium
    Calcium
    hysteresis
    Thermal noise
    thermal noise
    Doping (additives)
    Heating
    Thin films
    heating
    Electric potential
    electric potential
    Substrates
    products
    thin films

    Cite this

    Ransley, J. H. T., McBrien, P. F., Burnell, G., Tarte, E. J., Evetts, J. E., Schulz, R. R., ... Mannhart, J. (2004). Capacitance measurements on grain boundaries in Y1-xCaxBa2Cu3O7-δ. Physical Review B (Condensed Matter and Materials Physics), 70, [104502]. https://doi.org/10.1103/PhysRevB.70.104502
    Ransley, J.H.T. ; McBrien, P.F. ; Burnell, G. ; Tarte, E.J. ; Evetts, J.E. ; Schulz, R.R. ; Schneider, C.W. ; Schmehl, A. ; Bielefeldt, H. ; Hilgenkamp, H. ; Mannhart, J. / Capacitance measurements on grain boundaries in Y1-xCaxBa2Cu3O7-δ. In: Physical Review B (Condensed Matter and Materials Physics). 2004 ; Vol. 70.
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    title = "Capacitance measurements on grain boundaries in Y1-xCaxBa2Cu3O7-δ",
    abstract = "The capacitance of 24°[001] tilt calcium doped Y1−xCaxBa2Cu3O7−δ grain boundaries has been measured for thin films with x in the range 0.0–0.3. The capacitance was determined from the hysteresis in the I−V characteristic. By measuring the capacitance as a function of the voltage across the junctions it was possible to observe the contribution of both parasitic substrate capacitance and heating to the hysteresis. These effects enable the determination of the intrinsic capacitance of the grain boundaries. The effect of thermal noise on the measurement is also assessed, and found to be much less than the observed changes in the capacitance. The capacitance is found to increase as the calcium doping increases: from 0.2 Fm−2 for x=0.0 to a maximum of 1.2 Fm−2 for x=0.3. The changes in the capacitance per unit area are observed to be inversely proportional to the corresponding changes in the resistance area product.",
    author = "J.H.T. Ransley and P.F. McBrien and G. Burnell and E.J. Tarte and J.E. Evetts and R.R. Schulz and C.W. Schneider and A. Schmehl and H. Bielefeldt and H. Hilgenkamp and J. Mannhart",
    year = "2004",
    doi = "10.1103/PhysRevB.70.104502",
    language = "English",
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    journal = "Physical review B: Covering condensed matter and materials physics",
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    Ransley, JHT, McBrien, PF, Burnell, G, Tarte, EJ, Evetts, JE, Schulz, RR, Schneider, CW, Schmehl, A, Bielefeldt, H, Hilgenkamp, H & Mannhart, J 2004, 'Capacitance measurements on grain boundaries in Y1-xCaxBa2Cu3O7-δ', Physical Review B (Condensed Matter and Materials Physics), vol. 70, 104502. https://doi.org/10.1103/PhysRevB.70.104502

    Capacitance measurements on grain boundaries in Y1-xCaxBa2Cu3O7-δ. / Ransley, J.H.T.; McBrien, P.F.; Burnell, G.; Tarte, E.J.; Evetts, J.E.; Schulz, R.R.; Schneider, C.W.; Schmehl, A.; Bielefeldt, H.; Hilgenkamp, H.; Mannhart, J.

    In: Physical Review B (Condensed Matter and Materials Physics), Vol. 70, 104502, 2004.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Capacitance measurements on grain boundaries in Y1-xCaxBa2Cu3O7-δ

    AU - Ransley, J.H.T.

    AU - McBrien, P.F.

    AU - Burnell, G.

    AU - Tarte, E.J.

    AU - Evetts, J.E.

    AU - Schulz, R.R.

    AU - Schneider, C.W.

    AU - Schmehl, A.

    AU - Bielefeldt, H.

    AU - Hilgenkamp, H.

    AU - Mannhart, J.

    PY - 2004

    Y1 - 2004

    N2 - The capacitance of 24°[001] tilt calcium doped Y1−xCaxBa2Cu3O7−δ grain boundaries has been measured for thin films with x in the range 0.0–0.3. The capacitance was determined from the hysteresis in the I−V characteristic. By measuring the capacitance as a function of the voltage across the junctions it was possible to observe the contribution of both parasitic substrate capacitance and heating to the hysteresis. These effects enable the determination of the intrinsic capacitance of the grain boundaries. The effect of thermal noise on the measurement is also assessed, and found to be much less than the observed changes in the capacitance. The capacitance is found to increase as the calcium doping increases: from 0.2 Fm−2 for x=0.0 to a maximum of 1.2 Fm−2 for x=0.3. The changes in the capacitance per unit area are observed to be inversely proportional to the corresponding changes in the resistance area product.

    AB - The capacitance of 24°[001] tilt calcium doped Y1−xCaxBa2Cu3O7−δ grain boundaries has been measured for thin films with x in the range 0.0–0.3. The capacitance was determined from the hysteresis in the I−V characteristic. By measuring the capacitance as a function of the voltage across the junctions it was possible to observe the contribution of both parasitic substrate capacitance and heating to the hysteresis. These effects enable the determination of the intrinsic capacitance of the grain boundaries. The effect of thermal noise on the measurement is also assessed, and found to be much less than the observed changes in the capacitance. The capacitance is found to increase as the calcium doping increases: from 0.2 Fm−2 for x=0.0 to a maximum of 1.2 Fm−2 for x=0.3. The changes in the capacitance per unit area are observed to be inversely proportional to the corresponding changes in the resistance area product.

    U2 - 10.1103/PhysRevB.70.104502

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    JO - Physical review B: Covering condensed matter and materials physics

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    SN - 2469-9950

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