Capacitated two-echelon inventory models for repairable item systems

Z.M. Avsar, Willem H.M. Zijm

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageUndefined
Title of host publicationAnalysis and Modeling of Manufacturing Systems
EditorsS.B. Gershwin, Y. Dallery, C.T. Papadopoulos, J.M. Smith
Place of PublicationBoston
PublisherKluwer Academic Publishers
Number of pages36
ISBN (Print)1-4020-7303-8
Publication statusPublished - 2003

Publication series

NameInternational series in operations & management science


  • METIS-212226

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