Capacitated two-echelon inventory models for repairable item systems

Z.M. Avsar, Willem H.M. Zijm

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageUndefined
Title of host publicationAnalysis and Modeling of Manufacturing Systems
EditorsS.B. Gershwin, Y. Dallery, C.T. Papadopoulos, J.M. Smith
Place of PublicationBoston
PublisherKluwer Academic Publishers
Pages1-36
Number of pages36
ISBN (Print)1-4020-7303-8
Publication statusPublished - 2003

Publication series

NameInternational series in operations & management science
Number60

Keywords

  • METIS-212226

Cite this

Avsar, Z. M., & Zijm, W. H. M. (2003). Capacitated two-echelon inventory models for repairable item systems. In S. B. Gershwin, Y. Dallery, C. T. Papadopoulos, & J. M. Smith (Eds.), Analysis and Modeling of Manufacturing Systems (pp. 1-36). (International series in operations & management science; No. 60). Boston: Kluwer Academic Publishers.