Capacitated two-echelon inventory models for repairable item systems

Z.M. Avsar, Willem H.M. Zijm

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageUndefined
Title of host publicationAnalysis and Modeling of Manufacturing Systems
EditorsS.B. Gershwin, Y. Dallery, C.T. Papadopoulos, J.M. Smith
Place of PublicationBoston
PublisherKluwer Academic Publishers
Pages1-36
Number of pages36
ISBN (Print)1-4020-7303-8
Publication statusPublished - 2003

Publication series

NameInternational series in operations & management science
Number60

Keywords

  • METIS-212226

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