Capacitated Two-Echelon Inventory Models for Repairable Item Systems

Z.M. Avsar, Willem H.M. Zijm

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageUndefined
Title of host publicationAnalysis and Modeling of Manufacturing Systems
EditorsS.B. Gershwin
Place of PublicationBoston
PublisherKluwer Academic Publishers
Pages-
ISBN (Print)1-420-7303-8
Publication statusPublished - 2002

Keywords

  • METIS-211030

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