Capillarity at the nanoscale: an AFM view

Friedrich Gunther Mugele, T. Becker, R. Nikopoulos, M. Kohonen, S. Herminghaus

Research output: Contribution to journalArticleAcademic

51 Citations (Scopus)

Abstract

We have used atomic force microscopy (AFM) to image liquid droplets on solid substrates. The technique is applied to determine the contact line tension. Compared to conventional optical contact angle measurements, the AFM extends the range of accessible drop sizes by three orders of magnitude. We analyze the global shape of the droplets and the local profiles in the vicinity of the contact line. These two approaches show that the optical measurement overestimates the line tension by approximately four orders of magnitude.
Original languageUndefined
Pages (from-to)951-964
JournalJournal of adhesion science and technology
Volume16
Issue number7
DOIs
Publication statusPublished - 2002

Keywords

  • IR-57263

Cite this