Changes in bursting caused by learning

J. Stegenga, Jakob le Feber, Enrico Marani, Wim Rutten

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    20 Downloads (Pure)

    Abstract

    The localization of learning in dissociated cultures to the stimulation-evaluation electrode pair was studied. The cultures were trained using the Conditional Repetitive Stimulation (CRS) algorithm, in which repetitive focal stimulation is ended when a preset ratio of desired responses is achieved. We found that CRS can be used to strengthen an initially weak stimulus-response relationship. We used estimations of the instantaneous firing frequencies per electrode during spontaneous network bursts (NBs), called phase profiles, to determine the spatial extent of the changes required to establish a new stimulus-response relationship in the network. We found significant changes in the profiles, both on the stimulated and observed electrode pair, but also at numerous other sites. The results indicate that most of the changes are uncontrolled and that the whole network is involved during learning.
    Original languageUndefined
    Title of host publicationProceedings of the 6th international meeting on substrate-integrated micro electrode arrays
    Place of PublicationStuttgard, Germany
    PublisherBIOPRO Baden-Wuerttemberg GmbH, Stuttgart, Germany
    Pages87-88
    Number of pages2
    ISBN (Print)3-938345-05-5
    Publication statusPublished - 8 Jul 2008
    Event6th international meeting on substrate-integrated micro electrode arrays 2008 - Stuttgart, Germany
    Duration: 8 Jul 200811 Jul 2008
    Conference number: 6

    Publication series

    Name
    NumberXXI

    Conference

    Conference6th international meeting on substrate-integrated micro electrode arrays 2008
    CountryGermany
    CityStuttgart
    Period8/07/0811/07/08

    Keywords

    • EWI-13041
    • METIS-251066
    • IR-60459
    • BSS-Neurotechnology and cellular engineering

    Cite this

    Stegenga, J., le Feber, J., Marani, E., & Rutten, W. (2008). Changes in bursting caused by learning. In Proceedings of the 6th international meeting on substrate-integrated micro electrode arrays (pp. 87-88). Stuttgard, Germany: BIOPRO Baden-Wuerttemberg GmbH, Stuttgart, Germany.