Characterisation of Photodiodes in 22 nm FDSOI at 850 nm

Jelle Hette Theodorus Bakker*, Mark Stefan Oude Alink, Jurriaan Schmitz, Bram Nauta

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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We present the analysis and measurement results of photodiodes (PDs) fabricated in 22 nm Fully-Depleted Silicon-On-Insulator (FDSOI) technology at a wavelength of 850 nm. To the best of our knowledge this is the first paper to give detailed information about PDs in 22 nm FDSOI. FDSOI has the unique opportunity to place a PD in SOI, which is potentially very fast, on top of bulk devices such as PNP-transistors for temperature sensors. Its measured responsivity is 4 μA/W at a bandwidth (BW) of 3.4 GHz. Several bulk PDs, including PW/NW/DNW, PW/DNW/PSUB, and NW/PSUB have also been characterised. They have responsivities between 6 mA/W and 207 mA/W and BWs between 23 MHz and 5.8 GHz. 22 nm FDSOI shows potential for fully-integrated high-speed optical receivers, as it combines ∼90 nm bulk CMOS PD performance with 22 nm RF and digital processing capabilities on a single die.
Original languageEnglish
Title of host publicationESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)
Number of pages4
ISBN (Electronic)979-8-3503-0423-7
Publication statusPublished - 2 Oct 2023
EventIEEE 53rd European Solid-State Device Research Conference, ESSDERC 2023 - Lisbon, Portugal
Duration: 11 Sept 202314 Sept 2023
Conference number: 53


ConferenceIEEE 53rd European Solid-State Device Research Conference, ESSDERC 2023
Abbreviated titleESSDERC 2023


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