Characteristics of advanced YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox edge type junctions

J. Gao; Y.M. Boguslavskij; B.B.G. Klopman; D. Terpstra; G.J. Gerritsma; H. Rogalla

doi:10.1063/1.105878

Characteristics of advanced YBa2Cu₃O_x/PrBa₂Cu₃O_x/YBa₂Cu₃O_x edge type junctions

J. Gao
, Y.M. Boguslavskij
, B.B.G. Klopman
, D. Terpstra
, G.J. Gerritsma
, H. Rogalla

Faculty of Science and Technology

Research output: Contribution to journal › Article › Academic › peer-review

80 Citations (Scopus)

252 Downloads (Pure)

Abstract

This letter describes the scaling behavior and Josephson properties of improved YBCO/PBCO/YBCO edge‐type junctions. The critical current, normal‐state resistance, and I_cRnproduct scale with barrier thickness and junction area. The coherence length of the PBCO barrier is estimated to be between 5 and 8 nm. As unambiguous evidence of the Josephson behavior, the microwave response as a function of microwave power, as well as the current modulation with applied magnetic field, have been studied: well‐developed Shapiro steps at 10 GHz have been observed, and the modulation of I_c(H) shows Fraunhofer‐like behavior with 95% I_c suppression.

Original language	English
Pages (from-to)	2754-2756
Number of pages	3
Journal	Applied physics letters
Volume	59
Issue number	21
DOIs	https://doi.org/10.1063/1.105878
Publication status	Published - 1991

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title = "Characteristics of advanced YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox edge type junctions",

abstract = "This letter describes the scaling behavior and Josephson properties of improved YBCO/PBCO/YBCO edge‐type junctions. The critical current, normal‐state resistance, and IcRn product scale with barrier thickness and junction area. The coherence length of the PBCO barrier is estimated to be between 5 and 8 nm. As unambiguous evidence of the Josephson behavior, the microwave response as a function of microwave power, as well as the current modulation with applied magnetic field, have been studied: well‐developed Shapiro steps at 10 GHz have been observed, and the modulation of Ic(H) shows Fraunhofer‐like behavior with 95\% Ic suppression.",

author = "J. Gao and Y.M. Boguslavskij and B.B.G. Klopman and D. Terpstra and G.J. Gerritsma and H. Rogalla",

year = "1991",

doi = "10.1063/1.105878",

language = "English",

volume = "59",

pages = "2754--2756",

journal = "Applied physics letters",

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T1 - Characteristics of advanced YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox edge type junctions

AU - Gao, J.

AU - Boguslavskij, Y.M.

AU - Klopman, B.B.G.

AU - Terpstra, D.

AU - Gerritsma, G.J.

AU - Rogalla, H.

PY - 1991

Y1 - 1991

N2 - This letter describes the scaling behavior and Josephson properties of improved YBCO/PBCO/YBCO edge‐type junctions. The critical current, normal‐state resistance, and IcRn product scale with barrier thickness and junction area. The coherence length of the PBCO barrier is estimated to be between 5 and 8 nm. As unambiguous evidence of the Josephson behavior, the microwave response as a function of microwave power, as well as the current modulation with applied magnetic field, have been studied: well‐developed Shapiro steps at 10 GHz have been observed, and the modulation of Ic(H) shows Fraunhofer‐like behavior with 95% Ic suppression.

AB - This letter describes the scaling behavior and Josephson properties of improved YBCO/PBCO/YBCO edge‐type junctions. The critical current, normal‐state resistance, and IcRn product scale with barrier thickness and junction area. The coherence length of the PBCO barrier is estimated to be between 5 and 8 nm. As unambiguous evidence of the Josephson behavior, the microwave response as a function of microwave power, as well as the current modulation with applied magnetic field, have been studied: well‐developed Shapiro steps at 10 GHz have been observed, and the modulation of Ic(H) shows Fraunhofer‐like behavior with 95% Ic suppression.

U2 - 10.1063/1.105878

DO - 10.1063/1.105878

M3 - Article

SN - 0003-6951

VL - 59

SP - 2754

EP - 2756

JO - Applied physics letters

JF - Applied physics letters

IS - 21

ER -

Characteristics of advanced YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox edge type junctions

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Characteristics of advanced YBa2Cu₃O_x/PrBa₂Cu₃O_x/YBa₂Cu₃O_x edge type junctions