Abstract
In the subthreshold region of JFETs a reach-through diode is formed between the top and bottom gates. This has consequences for the application of separated-gate JFETs.
Original language | English |
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Pages (from-to) | 1244-1246 |
Number of pages | 3 |
Journal | Electronics letters |
Volume | 22 |
Issue number | 23 |
DOIs | |
Publication status | Published - 1 Jan 1986 |
Externally published | Yes |
Keywords
- FETs
- Junction structures
- Semiconductor devices and materials