Characterization of Bragg gratings in Al2O3 waveguides fabricated by focused ion beam milling and laser interference lithography

F. Ay; E. Bernhardi; L. Agazzi; J. Bradley; K. Wörhoff; M. Pollnau; R.M. de Ridder

doi:10.1364/CLEO.2010.CMQ4

Characterization of Bragg gratings in Al₂O₃ waveguides fabricated by focused ion beam milling and laser interference lithography

F. Ay, E. Bernhardi, L. Agazzi, J. Bradley, K. Wörhoff, M. Pollnau, R.M. de Ridder

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Optical grating cavities in Al2O3 channel waveguides were successfully defined by focused ion beam milling and laser interference lithography. Both methods are shown to be suitable for realizing resonant structures for on-chip waveguide lasers.

Original language	English
Title of host publication	Conference on Lasers and Electro-Optics 2010
Subtitle of host publication	San Jose, CA, United States, 16–21 May 2010
Place of Publication	Washington, D.C.
Publisher	Optical Society of America
Pages	CMQ4
Number of pages	2
ISBN (Print)	978-1-55752-889-6
DOIs	https://doi.org/10.1364/CLEO.2010.CMQ4
Publication status	Published - 1 May 2010
Event	Conference on Lasers and Electro-Optics, CLEO/QELS 2010 - San Jose, United States Duration: 16 May 2010 → 21 May 2010

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO/QELS 2010
Abbreviated title	CLEO/QELS
Country/Territory	United States
City	San Jose
Period	16/05/10 → 21/05/10

Keywords

Rare earth doped materials
IOMS-APD: Active Photonic Devices
Optical resonators
Integrated Optics devices

Access to Document

10.1364/CLEO.2010.CMQ4

Cite this

Ay, F., Bernhardi, E., Agazzi, L., Bradley, J., Wörhoff, K., Pollnau, M., & de Ridder, R. M. (2010). Characterization of Bragg gratings in Al₂O₃ waveguides fabricated by focused ion beam milling and laser interference lithography. In Conference on Lasers and Electro-Optics 2010: San Jose, CA, United States, 16–21 May 2010 (pp. CMQ4). Optical Society of America. https://doi.org/10.1364/CLEO.2010.CMQ4

@inproceedings{60c8216f1bee4f51b6fb8c2b992677ff,

title = "Characterization of Bragg gratings in Al2O3 waveguides fabricated by focused ion beam milling and laser interference lithography",

abstract = "Optical grating cavities in Al2O3 channel waveguides were successfully defined by focused ion beam milling and laser interference lithography. Both methods are shown to be suitable for realizing resonant structures for on-chip waveguide lasers.",

keywords = "Rare earth doped materials, IOMS-APD: Active Photonic Devices, Optical resonators, Integrated Optics devices",

author = "F. Ay and E. Bernhardi and L. Agazzi and J. Bradley and K. W{\"o}rhoff and M. Pollnau and {de Ridder}, R.M.",

year = "2010",

month = may,

day = "1",

doi = "10.1364/CLEO.2010.CMQ4",

language = "English",

isbn = "978-1-55752-889-6",

pages = "CMQ4",

booktitle = "Conference on Lasers and Electro-Optics 2010",

publisher = "Optical Society of America",

note = "Conference on Lasers and Electro-Optics, CLEO/QELS 2010, CLEO/QELS ; Conference date: 16-05-2010 Through 21-05-2010",

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Ay, F, Bernhardi, E, Agazzi, L, Bradley, J, Wörhoff, K, Pollnau, M & de Ridder, RM 2010, Characterization of Bragg gratings in Al₂O₃ waveguides fabricated by focused ion beam milling and laser interference lithography. in Conference on Lasers and Electro-Optics 2010: San Jose, CA, United States, 16–21 May 2010. Optical Society of America, Washington, D.C., pp. CMQ4, Conference on Lasers and Electro-Optics, CLEO/QELS 2010, San Jose, California, United States, 16/05/10. https://doi.org/10.1364/CLEO.2010.CMQ4

Characterization of Bragg gratings in Al₂O₃ waveguides fabricated by focused ion beam milling and laser interference lithography. / Ay, F.; Bernhardi, E.; Agazzi, L. et al.

Conference on Lasers and Electro-Optics 2010: San Jose, CA, United States, 16–21 May 2010. Washington, D.C. : Optical Society of America, 2010. p. CMQ4.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Characterization of Bragg gratings in Al2O3 waveguides fabricated by focused ion beam milling and laser interference lithography

AU - Ay, F.

AU - Bernhardi, E.

AU - Agazzi, L.

AU - Bradley, J.

AU - Wörhoff, K.

AU - Pollnau, M.

AU - de Ridder, R.M.

PY - 2010/5/1

Y1 - 2010/5/1

N2 - Optical grating cavities in Al2O3 channel waveguides were successfully defined by focused ion beam milling and laser interference lithography. Both methods are shown to be suitable for realizing resonant structures for on-chip waveguide lasers.

AB - Optical grating cavities in Al2O3 channel waveguides were successfully defined by focused ion beam milling and laser interference lithography. Both methods are shown to be suitable for realizing resonant structures for on-chip waveguide lasers.

KW - Rare earth doped materials

KW - IOMS-APD: Active Photonic Devices

KW - Optical resonators

KW - Integrated Optics devices

U2 - 10.1364/CLEO.2010.CMQ4

DO - 10.1364/CLEO.2010.CMQ4

M3 - Conference contribution

SN - 978-1-55752-889-6

SP - CMQ4

BT - Conference on Lasers and Electro-Optics 2010

PB - Optical Society of America

CY - Washington, D.C.

T2 - Conference on Lasers and Electro-Optics, CLEO/QELS 2010

Y2 - 16 May 2010 through 21 May 2010

ER -

Ay F, Bernhardi E, Agazzi L, Bradley J, Wörhoff K, Pollnau M et al. Characterization of Bragg gratings in Al₂O₃ waveguides fabricated by focused ion beam milling and laser interference lithography. In Conference on Lasers and Electro-Optics 2010: San Jose, CA, United States, 16–21 May 2010. Washington, D.C.: Optical Society of America. 2010. p. CMQ4 doi: 10.1364/CLEO.2010.CMQ4