Characterization of hot-carrier-induced degradation in MOSFETs and related issues for modeling

M.M. Lunenborg, H.C. de Graaff, A.J. Mouthaan, J.F. Verweij

    Research output: Other contribution › Other research output

    Original languageUndefined
    Place of PublicationBest Western Dish Hotel, Enschede
    Publication statusPublished - 14 Jun 1995

    Keywords

    • METIS-114877

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