Characterization of junctions based on multilayers electrodes for application as X-ray detectors

Alexandre Avraamovitch Golubov, A.W. Hamster, M..Y. Kupriyanov, Jakob Flokstra, Horst Rogalla

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the Seventh International Workshop on Low Temperture Detectors (LTD-7)
    Place of PublicationMunich, Germany
    Pages16-17
    Number of pages2
    Publication statusPublished - 9 Sep 1997

    Keywords

    • METIS-130435

    Cite this

    Golubov, A. A., Hamster, A. W., Kupriyanov, M. Y., Flokstra, J., & Rogalla, H. (1997). Characterization of junctions based on multilayers electrodes for application as X-ray detectors. In Proceedings of the Seventh International Workshop on Low Temperture Detectors (LTD-7) (pp. 16-17). Munich, Germany.