Characterization of porous silicon layer structures by spectroellipsometry

T. Lohner, D.J. Wentink, E. Vazsonyi, M. Fried

Research output: Contribution to conference › Poster › Other research output

Original language	English
Publication status	Published - 7 Nov 1997
Event	2nd Japan-Central Europe Joint Workshop on Modeling of Materials and Combustion 1996 - Budapest, Hungary Duration: 7 Nov 1996 → 9 Nov 1996 Conference number: 2

Workshop	2nd Japan-Central Europe Joint Workshop on Modeling of Materials and Combustion 1996
Country/Territory	Hungary
City	Budapest
Period	7/11/96 → 9/11/96

Cite this

@conference{4600601f06b24e1399fed0e5ea0ec3ba,

title = "Characterization of porous silicon layer structures by spectroellipsometry",

author = "T. Lohner and D.J. Wentink and E. Vazsonyi and M. Fried",

year = "1997",

month = nov,

day = "7",

language = "English",

note = "2nd Japan-Central Europe Joint Workshop on Modeling of Materials and Combustion 1996 ; Conference date: 07-11-1996 Through 09-11-1996",

}