Characterization of recessed Ohmic contacts to AlGaN/GaN

M. Hajlasz, J.J.T.M. Donkers, S.J. Sque, S.B.S. Heil, Dirk J Gravesteijn, F.J.R. Rietveld, Jurriaan Schmitz

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    6 Citations (Scopus)

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