Characterization of recessed Ohmic contacts to AlGaN/GaN

M. Hajlasz, J.J.T.M. Donkers, S.J. Sque, S.B.S. Heil, Dirk J Gravesteijn, F.J.R. Rietveld, Jurriaan Schmitz

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    6 Citations (Scopus)


    Dive into the research topics of 'Characterization of recessed Ohmic contacts to AlGaN/GaN'. Together they form a unique fingerprint.