Characterization of silylated ISFETs by ion-step measuring method

J.C. van Kerkhof, Piet Bergveld

    Research output: Contribution to journalArticleAcademicpeer-review

    1 Citation (Scopus)
    Original languageUndefined
    Pages (from-to)271-291
    JournalSensors and materials
    Volume8
    Issue number5
    Publication statusPublished - 1996

    Keywords

    • METIS-111975

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