Characterization of single step electrodeposited Cu2ZnSnS4 thin films

M. H. Rashid, J. Rabeya, M. H. Doha, O. Islam (Corresponding Author), P. Reith, Gerben Hopman, H. Hilgenkamp

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Abstract

Electrodeposited copper zinc tin sulfide (CZTS) thin films grown on conducting glass substrates are investigated in this report. The photoelectrochemical cell (PEC), optical, structural and morphological properties of the deposited films have been characterized. PEC measurements of the CZTS thin film showed p-type electrical conductivity. Optical measurement showed that the transmittance of CZTS films is observed to about 0.5–3.4% in the wavelength range 300–1100 nm. It is also observed that the absorbance of the CZTS thin films rapidly increases in the wavelength range 580–620 nm and then it decreases slowly. The band gap of the CZTS thin film is observed to be in the range 1.6–2.2 eV. The transmittance and band gap decreases upon annealing at different temperatures but the absorbance and the grain size increases due to the improvement of crystalline quality upon annealing. From the X-ray diffraction study, the CZTS films are found to be polycrystalline with (112), (200), (105), (204), (312), (220) orientations of the tetragonal structure. The average crystallite size is estimated to 23 nm for as-deposited film, 26 nm for annealed at 300 °C and 40 nm for annealed at 350 °C. It is found from SEM study that the precursor film shows non-uniform distribution of agglomerated particles with well-defined boundaries. As the annealing temperature increases, the crystallization of the films is observed to improve, and hence the morphology of as-deposited precursor film is observed to change into the larger flat grains upon annealing.

Original languageEnglish
Pages (from-to)256-262
Number of pages7
JournalJournal of Optics (India)
Volume47
Issue number3
Early online date19 May 2018
DOIs
Publication statusPublished - 1 Sep 2018

Fingerprint

Tin
Zinc
sulfides
Copper
tin
zinc
Thin films
copper
thin films
Annealing
Photoelectrochemical cells
annealing
transmittance
Energy gap
Wavelength
Crystallite size
Crystallization
Cu2ZnSnS4
cells
optical measurement

Keywords

  • UT-Hybrid-D
  • Morphological properties
  • Optical properties
  • Single step electrodeposition
  • Structural properties
  • CuZnSnS thin films

Cite this

Rashid, M. H. ; Rabeya, J. ; Doha, M. H. ; Islam, O. ; Reith, P. ; Hopman, Gerben ; Hilgenkamp, H. / Characterization of single step electrodeposited Cu2ZnSnS4 thin films. In: Journal of Optics (India). 2018 ; Vol. 47, No. 3. pp. 256-262.
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abstract = "Electrodeposited copper zinc tin sulfide (CZTS) thin films grown on conducting glass substrates are investigated in this report. The photoelectrochemical cell (PEC), optical, structural and morphological properties of the deposited films have been characterized. PEC measurements of the CZTS thin film showed p-type electrical conductivity. Optical measurement showed that the transmittance of CZTS films is observed to about 0.5–3.4{\%} in the wavelength range 300–1100 nm. It is also observed that the absorbance of the CZTS thin films rapidly increases in the wavelength range 580–620 nm and then it decreases slowly. The band gap of the CZTS thin film is observed to be in the range 1.6–2.2 eV. The transmittance and band gap decreases upon annealing at different temperatures but the absorbance and the grain size increases due to the improvement of crystalline quality upon annealing. From the X-ray diffraction study, the CZTS films are found to be polycrystalline with (112), (200), (105), (204), (312), (220) orientations of the tetragonal structure. The average crystallite size is estimated to 23 nm for as-deposited film, 26 nm for annealed at 300 °C and 40 nm for annealed at 350 °C. It is found from SEM study that the precursor film shows non-uniform distribution of agglomerated particles with well-defined boundaries. As the annealing temperature increases, the crystallization of the films is observed to improve, and hence the morphology of as-deposited precursor film is observed to change into the larger flat grains upon annealing.",
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Rashid, MH, Rabeya, J, Doha, MH, Islam, O, Reith, P, Hopman, G & Hilgenkamp, H 2018, 'Characterization of single step electrodeposited Cu2ZnSnS4 thin films' Journal of Optics (India), vol. 47, no. 3, pp. 256-262. https://doi.org/10.1007/s12596-018-0463-0

Characterization of single step electrodeposited Cu2ZnSnS4 thin films. / Rashid, M. H.; Rabeya, J.; Doha, M. H.; Islam, O. (Corresponding Author); Reith, P.; Hopman, Gerben; Hilgenkamp, H.

In: Journal of Optics (India), Vol. 47, No. 3, 01.09.2018, p. 256-262.

Research output: Contribution to journalArticleAcademicpeer-review

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AB - Electrodeposited copper zinc tin sulfide (CZTS) thin films grown on conducting glass substrates are investigated in this report. The photoelectrochemical cell (PEC), optical, structural and morphological properties of the deposited films have been characterized. PEC measurements of the CZTS thin film showed p-type electrical conductivity. Optical measurement showed that the transmittance of CZTS films is observed to about 0.5–3.4% in the wavelength range 300–1100 nm. It is also observed that the absorbance of the CZTS thin films rapidly increases in the wavelength range 580–620 nm and then it decreases slowly. The band gap of the CZTS thin film is observed to be in the range 1.6–2.2 eV. The transmittance and band gap decreases upon annealing at different temperatures but the absorbance and the grain size increases due to the improvement of crystalline quality upon annealing. From the X-ray diffraction study, the CZTS films are found to be polycrystalline with (112), (200), (105), (204), (312), (220) orientations of the tetragonal structure. The average crystallite size is estimated to 23 nm for as-deposited film, 26 nm for annealed at 300 °C and 40 nm for annealed at 350 °C. It is found from SEM study that the precursor film shows non-uniform distribution of agglomerated particles with well-defined boundaries. As the annealing temperature increases, the crystallization of the films is observed to improve, and hence the morphology of as-deposited precursor film is observed to change into the larger flat grains upon annealing.

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Rashid MH, Rabeya J, Doha MH, Islam O, Reith P, Hopman G et al. Characterization of single step electrodeposited Cu2ZnSnS4 thin films. Journal of Optics (India). 2018 Sep 1;47(3):256-262. https://doi.org/10.1007/s12596-018-0463-0