Characterization of stress and texture in RTCVD poly-Si layers by X-ray diffraction

I. Barsony, J.G.E. Klappe, T.W. Ryan

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings Symposium Materials Research Society, Vol. 239
    Place of PublicationBoston
    Number of pages0
    Publication statusPublished - 2 Dec 1992


    • METIS-114009

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