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Characterization of thin alumina films prepared by metal-organic chemical vapour deposition (MOCVD) by high resolution SEM

  • W.F. Lisowski
  • , A.H.J. van den Berg
  • , M.A. Smithers
  • , V.A.C. Haanappel

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 5 Sept 1994
Event8. Arbeitstagung Angewandte Oberflaechenanalytik (AOFA 8) - Kaiserslautern, Duitsland
Duration: 5 Sept 1994 → …

Conference

Conference8. Arbeitstagung Angewandte Oberflaechenanalytik (AOFA 8)
CityKaiserslautern, Duitsland
Period5/09/94 → …

Keywords

  • METIS-133156

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