Characterizing reverberation chambers by measurements of the enhanced backscatter coefficient

C.R. Dunlap, C.L. Holloway, R. Pirkl, J. Ladbury, E.F. Kuester, D.A. Hill, G.S. van de Beek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    9 Citations (Scopus)

    Abstract

    Reverberation chambers (RC) are becoming a popular alternative testing facility for a wide range of electromagnetic applications. In order for these tests to have any meaning, we need to ensure that the RC is performing in a desired manner. One common approach for characterizing the RC is based on a measurement of field uniformity in the chamber. In this paper, we present an alternative technique for characterizing a RC, based on the enhanced backscatter coefficient (a quantity analogous to the enhanced backscatter that has been derived for scattering by a random medium) measured in the chamber.
    Original languageUndefined
    Title of host publication2012 IEEE International Symposium on Electromagnetic Compatibility
    Place of PublicationUSA
    PublisherIEEE Electromagnetic Compatibility Society
    Pages210-215
    Number of pages6
    ISBN (Print)978-1-4673-2059-7
    Publication statusPublished - 9 Aug 2012
    Event2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012 - Pittsburgh David L. Laurence Convention Center, Pittsburgh, United States
    Duration: 6 Aug 201210 Aug 2012

    Publication series

    Name
    PublisherIEEE Electromagnetic Compatibility Society

    Conference

    Conference2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012
    Abbreviated titleEMC
    CountryUnited States
    CityPittsburgh
    Period6/08/1210/08/12

    Keywords

    • IR-81462
    • EWI-22110
    • METIS-293169

    Cite this

    Dunlap, C. R., Holloway, C. L., Pirkl, R., Ladbury, J., Kuester, E. F., Hill, D. A., & van de Beek, G. S. (2012). Characterizing reverberation chambers by measurements of the enhanced backscatter coefficient. In 2012 IEEE International Symposium on Electromagnetic Compatibility (pp. 210-215). USA: IEEE Electromagnetic Compatibility Society.