Charge Transport after Hard Breakdown in Gate Oxides

T. Bearda, P.H. Woerlee, Hans Wallinga, M.M. Heyns

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)-
    JournalSolid-state electronics
    Publication statusPublished - 2001

    Keywords

    • METIS-202411

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