Chemical Force Microscopy: Nanometer-Scale Surface Analysis with Chemical Sensitivity

Holger Schönherr, Gyula J. Vancso

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

2 Citations (Scopus)
Original languageUndefined
Title of host publicationScanning Probe Micoscopies Beyond Imaging ¿ Manipulation of Molecules and Nanostructures
EditorsP Samori
Place of PublicationNew York
PublisherWiley & Sons
Pages275-314
Publication statusPublished - 2006

Keywords

  • METIS-232310

Cite this

Schönherr, H., & Vancso, G. J. (2006). Chemical Force Microscopy: Nanometer-Scale Surface Analysis with Chemical Sensitivity. In P. Samori (Ed.), Scanning Probe Micoscopies Beyond Imaging ¿ Manipulation of Molecules and Nanostructures (pp. 275-314). New York: Wiley & Sons.