Chromosome structure investigated with the atomic force microscope

Bart G. de Grooth, Constant A.J. Putman, Kees O. van der Werf, Niek F. van Hulst, Geeske van Oort, Jan Greve

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Abstract

We have developed an atomic force microscope (AFM) with an integrated optical microscope. The optical microscope consists of an inverted epi-illumination system that yields images in reflection or fluorescence of the sample. With this system it is possible to quickly locate an object of interest. A high-resolution image of the object thus selected can then be obtained with the AFM that is built on top of the optical microscope. In addition, the combined microscopes enable a direct comparison between the optical image and the topography of the same object. The microscope is used to study the structure of metaphase chromosomes of eukaryotic cells. The topography of metaphase chromosomes reveal grooved structures that might indicate spiral structure of the chromatin. High resolution images reveal structures that can be ascribed to the end loops of the chromatin. The resolution of the AFM images was improved by using sharper tips obtained by carbon deposition on the Si3N4 cantilevers using a scanning electron microscope. Chromosomes which are treated to reveal the G- banding pattern in the optical microscope display a similar pattern when viewed with the AFM, as is shown by a direct comparison.
Original languageEnglish
Title of host publicationScanning Probe Microscopies
EditorsSrinivas Manne
Place of PublicationLos Angeles, CA
PublisherSPIE
Pages205-211
Number of pages6
ISBN (Print)0-8194-0785-2
DOIs
Publication statusPublished - 20 Jan 1992
EventSPIE OE/LASE 1992 - Los Angeles, United States
Duration: 19 Jan 199224 Jan 1992

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume1639

Conference

ConferenceSPIE OE/LASE 1992
Abbreviated titleOE/LASE
CountryUnited States
CityLos Angeles
Period19/01/9224/01/92

Fingerprint

chromosomes
microscopes
optical microscopes
chromatin
topography
high resolution
electron microscopes
illumination
fluorescence
scanning
carbon
cells

Keywords

  • IR-25715
  • METIS-130518

Cite this

de Grooth, B. G., Putman, C. A. J., van der Werf, K. O., van Hulst, N. F., van Oort, G., & Greve, J. (1992). Chromosome structure investigated with the atomic force microscope. In S. Manne (Ed.), Scanning Probe Microscopies (pp. 205-211). (Proceedings of SPIE; Vol. 1639). Los Angeles, CA: SPIE. https://doi.org/10.1117/12.58188
de Grooth, Bart G. ; Putman, Constant A.J. ; van der Werf, Kees O. ; van Hulst, Niek F. ; van Oort, Geeske ; Greve, Jan. / Chromosome structure investigated with the atomic force microscope. Scanning Probe Microscopies. editor / Srinivas Manne. Los Angeles, CA : SPIE, 1992. pp. 205-211 (Proceedings of SPIE).
@inproceedings{ab3718058b5e4563ab3def1f12e3e449,
title = "Chromosome structure investigated with the atomic force microscope",
abstract = "We have developed an atomic force microscope (AFM) with an integrated optical microscope. The optical microscope consists of an inverted epi-illumination system that yields images in reflection or fluorescence of the sample. With this system it is possible to quickly locate an object of interest. A high-resolution image of the object thus selected can then be obtained with the AFM that is built on top of the optical microscope. In addition, the combined microscopes enable a direct comparison between the optical image and the topography of the same object. The microscope is used to study the structure of metaphase chromosomes of eukaryotic cells. The topography of metaphase chromosomes reveal grooved structures that might indicate spiral structure of the chromatin. High resolution images reveal structures that can be ascribed to the end loops of the chromatin. The resolution of the AFM images was improved by using sharper tips obtained by carbon deposition on the Si3N4 cantilevers using a scanning electron microscope. Chromosomes which are treated to reveal the G- banding pattern in the optical microscope display a similar pattern when viewed with the AFM, as is shown by a direct comparison.",
keywords = "IR-25715, METIS-130518",
author = "{de Grooth}, {Bart G.} and Putman, {Constant A.J.} and {van der Werf}, {Kees O.} and {van Hulst}, {Niek F.} and {van Oort}, Geeske and Jan Greve",
year = "1992",
month = "1",
day = "20",
doi = "10.1117/12.58188",
language = "English",
isbn = "0-8194-0785-2",
series = "Proceedings of SPIE",
publisher = "SPIE",
pages = "205--211",
editor = "Srinivas Manne",
booktitle = "Scanning Probe Microscopies",
address = "United States",

}

de Grooth, BG, Putman, CAJ, van der Werf, KO, van Hulst, NF, van Oort, G & Greve, J 1992, Chromosome structure investigated with the atomic force microscope. in S Manne (ed.), Scanning Probe Microscopies. Proceedings of SPIE, vol. 1639, SPIE, Los Angeles, CA, pp. 205-211, SPIE OE/LASE 1992, Los Angeles, United States, 19/01/92. https://doi.org/10.1117/12.58188

Chromosome structure investigated with the atomic force microscope. / de Grooth, Bart G.; Putman, Constant A.J.; van der Werf, Kees O.; van Hulst, Niek F.; van Oort, Geeske; Greve, Jan.

Scanning Probe Microscopies. ed. / Srinivas Manne. Los Angeles, CA : SPIE, 1992. p. 205-211 (Proceedings of SPIE; Vol. 1639).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Chromosome structure investigated with the atomic force microscope

AU - de Grooth, Bart G.

AU - Putman, Constant A.J.

AU - van der Werf, Kees O.

AU - van Hulst, Niek F.

AU - van Oort, Geeske

AU - Greve, Jan

PY - 1992/1/20

Y1 - 1992/1/20

N2 - We have developed an atomic force microscope (AFM) with an integrated optical microscope. The optical microscope consists of an inverted epi-illumination system that yields images in reflection or fluorescence of the sample. With this system it is possible to quickly locate an object of interest. A high-resolution image of the object thus selected can then be obtained with the AFM that is built on top of the optical microscope. In addition, the combined microscopes enable a direct comparison between the optical image and the topography of the same object. The microscope is used to study the structure of metaphase chromosomes of eukaryotic cells. The topography of metaphase chromosomes reveal grooved structures that might indicate spiral structure of the chromatin. High resolution images reveal structures that can be ascribed to the end loops of the chromatin. The resolution of the AFM images was improved by using sharper tips obtained by carbon deposition on the Si3N4 cantilevers using a scanning electron microscope. Chromosomes which are treated to reveal the G- banding pattern in the optical microscope display a similar pattern when viewed with the AFM, as is shown by a direct comparison.

AB - We have developed an atomic force microscope (AFM) with an integrated optical microscope. The optical microscope consists of an inverted epi-illumination system that yields images in reflection or fluorescence of the sample. With this system it is possible to quickly locate an object of interest. A high-resolution image of the object thus selected can then be obtained with the AFM that is built on top of the optical microscope. In addition, the combined microscopes enable a direct comparison between the optical image and the topography of the same object. The microscope is used to study the structure of metaphase chromosomes of eukaryotic cells. The topography of metaphase chromosomes reveal grooved structures that might indicate spiral structure of the chromatin. High resolution images reveal structures that can be ascribed to the end loops of the chromatin. The resolution of the AFM images was improved by using sharper tips obtained by carbon deposition on the Si3N4 cantilevers using a scanning electron microscope. Chromosomes which are treated to reveal the G- banding pattern in the optical microscope display a similar pattern when viewed with the AFM, as is shown by a direct comparison.

KW - IR-25715

KW - METIS-130518

U2 - 10.1117/12.58188

DO - 10.1117/12.58188

M3 - Conference contribution

SN - 0-8194-0785-2

T3 - Proceedings of SPIE

SP - 205

EP - 211

BT - Scanning Probe Microscopies

A2 - Manne, Srinivas

PB - SPIE

CY - Los Angeles, CA

ER -

de Grooth BG, Putman CAJ, van der Werf KO, van Hulst NF, van Oort G, Greve J. Chromosome structure investigated with the atomic force microscope. In Manne S, editor, Scanning Probe Microscopies. Los Angeles, CA: SPIE. 1992. p. 205-211. (Proceedings of SPIE). https://doi.org/10.1117/12.58188