Circuit hot-electron degradation simulation with PRESS

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T. Phat-nguyen, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the ProRISC IEEE Benelux, Workshop on Circuits, Systems and Signal Processing
    Place of PublicationPapendal, Arnhem
    Publication statusPublished - 24 Mar 1994


    • METIS-114002

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