Circuit hot-electron degradation simulation with PRESS

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T. Phat-nguyen, J.F. Verweij

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the ProRISC IEEE Benelux, Workshop on Circuits, Systems and Signal Processing
Place of Publication	Papendal, Arnhem
Pages	157-161
Publication status	Published - 24 Mar 1994

Keywords

@inproceedings{7bb4f66391364b1b94b58dd5b0aa0242,

title = "Circuit hot-electron degradation simulation with PRESS",

keywords = "METIS-114002",

author = "M.M. Lunenborg and P.B.M. Wolbert and P.B.L. Meijer and T. Phat-nguyen and J.F. Verweij",

year = "1994",

month = mar,

day = "24",

language = "Undefined",

pages = "157--161",

booktitle = "Proceedings of the ProRISC IEEE Benelux, Workshop on Circuits, Systems and Signal Processing",

}

TY - GEN

T1 - Circuit hot-electron degradation simulation with PRESS

AU - Lunenborg, M.M.

AU - Wolbert, P.B.M.

AU - Meijer, P.B.L.

AU - Phat-nguyen, T.

AU - Verweij, J.F.

PY - 1994/3/24

Y1 - 1994/3/24

KW - METIS-114002

M3 - Conference contribution

SP - 157

EP - 161

BT - Proceedings of the ProRISC IEEE Benelux, Workshop on Circuits, Systems and Signal Processing

CY - Papendal, Arnhem

ER -