Circuit Hot-Electron Degradation with PRESS

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T.P. Nguyen, J.F. Verweij

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 17 Nov 1993
    EventFOM Werkgemeenschap Halfgeleiders 1993 - Veldhoven, Netherlands
    Duration: 17 Nov 199318 Nov 1993

    Conference

    ConferenceFOM Werkgemeenschap Halfgeleiders 1993
    CountryNetherlands
    CityVeldhoven
    Period17/11/9318/11/93

    Keywords

    • METIS-117380

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