Circuit Hot-Electron Degradation with PRESS

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T.P. Nguyen, J.F. Verweij

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 17 Nov 1993
Event	FOM Werkgemeenschap Halfgeleiders 1993 - Veldhoven, Netherlands Duration: 17 Nov 1993 → 18 Nov 1993

Conference	FOM Werkgemeenschap Halfgeleiders 1993
Country/Territory	Netherlands
City	Veldhoven
Period	17/11/93 → 18/11/93

Keywords

@conference{96bb53d5d03a49e2a7504fc14f993ce3,

title = "Circuit Hot-Electron Degradation with PRESS",

keywords = "METIS-117380",

author = "M.M. Lunenborg and P.B.M. Wolbert and P.B.L. Meijer and T.P. Nguyen and J.F. Verweij",

year = "1993",

month = nov,

day = "17",

language = "Undefined",

pages = "--",

note = "FOM Werkgemeenschap Halfgeleiders 1993 ; Conference date: 17-11-1993 Through 18-11-1993",

}