Clock Switching: A New Design for Current Test (DcT) Methods for Dynamic Logic Circuits

Richard Rosing, Andrew M.D. Richardson, Hans G. Kerkhoff, Antonia J. Acosta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the IEEE European Test Workshop (ETW 1998)
    Subtitle of host publicationSitges, Barcelona (SPAIN) May 27-29, 1998
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages189-190
    Number of pages2
    Publication statusPublished - 27 May 1998
    EventIEEE European Test Workshop, ETW 1998 - Sitges, Spain
    Duration: 27 May 199829 May 1998

    Conference

    ConferenceIEEE European Test Workshop, ETW 1998
    Abbreviated titleETW
    CountrySpain
    CitySitges
    Period27/05/9829/05/98

    Cite this

    Rosing, R., Richardson, A. M. D., Kerkhoff, H. G., & Acosta, A. J. (1998). Clock Switching: A New Design for Current Test (DcT) Methods for Dynamic Logic Circuits. In Proceedings of the IEEE European Test Workshop (ETW 1998): Sitges, Barcelona (SPAIN) May 27-29, 1998 (pp. 189-190). Piscataway, NJ: IEEE.