Clock Switching: A New Design for Current Test (DcT) Methods for Dynamic Logic Circuits

Richard Rosing, Andrew M.D. Richardson, Hans G. Kerkhoff, Antonia J. Acosta

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the IEEE European Test Workshop (ETW 1998)
Subtitle of host publication	Sitges, Barcelona (SPAIN) May 27-29, 1998
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	189-190
Number of pages	2
Publication status	Published - 27 May 1998
Event	IEEE European Test Workshop, ETW 1998 - Sitges, Spain Duration: 27 May 1998 → 29 May 1998

Conference	IEEE European Test Workshop, ETW 1998
Abbreviated title	ETW
Country/Territory	Spain
City	Sitges
Period	27/05/98 → 29/05/98

Cite this

@inproceedings{7a31b99ae5cf419dbcb6591d6559f77f,

title = "Clock Switching: A New Design for Current Test (DcT) Methods for Dynamic Logic Circuits",

author = "Richard Rosing and Richardson, {Andrew M.D.} and Kerkhoff, {Hans G.} and Acosta, {Antonia J.}",

year = "1998",

month = may,

day = "27",

language = "English",

pages = "189--190",

booktitle = "Proceedings of the IEEE European Test Workshop (ETW 1998)",

publisher = "IEEE",

address = "United States",

note = "IEEE European Test Workshop, ETW 1998, ETW ; Conference date: 27-05-1998 Through 29-05-1998",

}

Clock Switching: A New Design for Current Test (DcT) Methods for Dynamic Logic Circuits. / Rosing, Richard; Richardson, Andrew M.D.; Kerkhoff, Hans G. et al.
Proceedings of the IEEE European Test Workshop (ETW 1998): Sitges, Barcelona (SPAIN) May 27-29, 1998. Piscataway, NJ: IEEE, 1998. p. 189-190.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Clock Switching

T2 - IEEE European Test Workshop, ETW 1998

AU - Rosing, Richard

AU - Richardson, Andrew M.D.

AU - Kerkhoff, Hans G.

AU - Acosta, Antonia J.

PY - 1998/5/27

Y1 - 1998/5/27

M3 - Conference contribution

SP - 189

EP - 190

BT - Proceedings of the IEEE European Test Workshop (ETW 1998)

PB - IEEE

CY - Piscataway, NJ

Y2 - 27 May 1998 through 29 May 1998

ER -