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Clock Switching: A New Design for Current Test (DcT) Methods for Dynamic Logic Circuits

  • Richard Rosing
  • , Andrew M.D. Richardson
  • , Hans G. Kerkhoff
  • , Antonia J. Acosta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the IEEE European Test Workshop (ETW 1998)
    Subtitle of host publicationSitges, Barcelona (SPAIN) May 27-29, 1998
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages189-190
    Number of pages2
    Publication statusPublished - 27 May 1998
    EventIEEE European Test Workshop, ETW 1998 - Sitges, Spain
    Duration: 27 May 199829 May 1998

    Conference

    ConferenceIEEE European Test Workshop, ETW 1998
    Abbreviated titleETW
    Country/TerritorySpain
    CitySitges
    Period27/05/9829/05/98

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