CO2 sorption of a ceramic separation membrane

Herbert Wormeester; Nieck Edwin Benes; G.I. Spijksma; H. Verweij; Bene Poelsema

doi:10.1016/j.tsf.2004.01.041

CO2 sorption of a ceramic separation membrane

Herbert Wormeester, Nieck Edwin Benes, G.I. Spijksma, H. Verweij, Bene Poelsema

Research output: Contribution to journal › Article › Academic › peer-review

6 Citations (Scopus)

Abstract

The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.

Original language	Undefined
Pages (from-to)	747-751
Number of pages	5
Journal	Thin solid films
Volume	455-456
DOIs	https://doi.org/10.1016/j.tsf.2004.01.041
Publication status	Published - 2004

Keywords

METIS-220914
IR-71975

Access to Document

10.1016/j.tsf.2004.01.041

Cite this

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title = "CO2 sorption of a ceramic separation membrane",

abstract = "The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.",

keywords = "METIS-220914, IR-71975",

author = "Herbert Wormeester and Benes, {Nieck Edwin} and G.I. Spijksma and H. Verweij and Bene Poelsema",

note = "The 3rd International Conference on Spectroscopic Ellipsometry ",

year = "2004",

doi = "10.1016/j.tsf.2004.01.041",

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journal = "Thin solid films",

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TY - JOUR

T1 - CO2 sorption of a ceramic separation membrane

AU - Wormeester, Herbert

AU - Benes, Nieck Edwin

AU - Spijksma, G.I.

AU - Verweij, H.

AU - Poelsema, Bene

N1 - The 3rd International Conference on Spectroscopic Ellipsometry

PY - 2004

Y1 - 2004

N2 - The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.

AB - The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.

KW - METIS-220914

KW - IR-71975

U2 - 10.1016/j.tsf.2004.01.041

DO - 10.1016/j.tsf.2004.01.041

M3 - Article

VL - 455-456

SP - 747

EP - 751

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -