Abstract
| Original language | Undefined |
|---|---|
| Pages (from-to) | 747-751 |
| Number of pages | 5 |
| Journal | Thin solid films |
| Volume | 455-456 |
| DOIs | |
| Publication status | Published - 2004 |
Keywords
- METIS-220914
- IR-71975
Cite this
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CO2 sorption of a ceramic separation membrane. / Wormeester, Herbert; Benes, Nieck Edwin; Spijksma, G.I.; Verweij, H.; Poelsema, Bene.
In: Thin solid films, Vol. 455-456, 2004, p. 747-751.Research output: Contribution to journal › Article › Academic › peer-review
TY - JOUR
T1 - CO2 sorption of a ceramic separation membrane
AU - Wormeester, Herbert
AU - Benes, Nieck Edwin
AU - Spijksma, G.I.
AU - Verweij, H.
AU - Poelsema, Bene
N1 - The 3rd International Conference on Spectroscopic Ellipsometry
PY - 2004
Y1 - 2004
N2 - The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.
AB - The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.
KW - METIS-220914
KW - IR-71975
U2 - 10.1016/j.tsf.2004.01.041
DO - 10.1016/j.tsf.2004.01.041
M3 - Article
VL - 455-456
SP - 747
EP - 751
JO - Thin solid films
JF - Thin solid films
SN - 0040-6090
ER -