CO2 sorption of a ceramic separation membrane

Research output: Contribution to journalArticleAcademicpeer-review

6 Citations (Scopus)

Abstract

The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.
Original languageUndefined
Pages (from-to)747-751
Number of pages5
JournalThin solid films
Volume455-456
DOIs
Publication statusPublished - 2004

Keywords

  • METIS-220914
  • IR-71975

Cite this

@article{39861a5a784c4cc088c6902cf6470e91,
title = "CO2 sorption of a ceramic separation membrane",
abstract = "The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.",
keywords = "METIS-220914, IR-71975",
author = "Herbert Wormeester and Benes, {Nieck Edwin} and G.I. Spijksma and H. Verweij and Bene Poelsema",
note = "The 3rd International Conference on Spectroscopic Ellipsometry",
year = "2004",
doi = "10.1016/j.tsf.2004.01.041",
language = "Undefined",
volume = "455-456",
pages = "747--751",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",

}

CO2 sorption of a ceramic separation membrane. / Wormeester, Herbert; Benes, Nieck Edwin; Spijksma, G.I.; Verweij, H.; Poelsema, Bene.

In: Thin solid films, Vol. 455-456, 2004, p. 747-751.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - CO2 sorption of a ceramic separation membrane

AU - Wormeester, Herbert

AU - Benes, Nieck Edwin

AU - Spijksma, G.I.

AU - Verweij, H.

AU - Poelsema, Bene

N1 - The 3rd International Conference on Spectroscopic Ellipsometry

PY - 2004

Y1 - 2004

N2 - The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.

AB - The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.

KW - METIS-220914

KW - IR-71975

U2 - 10.1016/j.tsf.2004.01.041

DO - 10.1016/j.tsf.2004.01.041

M3 - Article

VL - 455-456

SP - 747

EP - 751

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -