CO2 Sorption of a Thin Silica Layer Determined with Spectroscopic Ellipsometry

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 27 May 2002
EventFOM Materials Research 2002 - Veldhoven, Netherlands
Duration: 27 May 200228 May 2002

Conference

ConferenceFOM Materials Research 2002
CountryNetherlands
CityVeldhoven
Period27/05/0228/05/02

Keywords

  • METIS-208024

Cite this

Benes, N. E., Spijksma, G. I., Verweij, H., Wormeester, H., & Poelsema, B. (2002). CO2 Sorption of a Thin Silica Layer Determined with Spectroscopic Ellipsometry. -. Poster session presented at FOM Materials Research 2002, Veldhoven, Netherlands.