Coherent imaging of guided fields

Marcello Balistreri; Niek van Hulst

Coherent imaging of guided fields

Marcello Balistreri, Niek van Hulst

Optical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

A photon scanning tunneling I atomic force microscope will be developed to measure the field distribution (amplitude, phase and time) in integrated optical devices. The microscope will be applied on real devices like splitters, converters, multiplexers, etc.

Original language	English
Title of host publication	1996 IEEE/LEOS Symposium Benelux Chapter
Editors	A. Driessen, R.M. de Ridder
Place of Publication	Enschede
Publisher	University of Twente, MESA Research Institute
Pages	218-221
Number of pages	4
ISBN (Print)	90-365-0920-5
Publication status	Published - 28 Nov 1996
Event	IEEE/LEOS Symposium Benelux Chapter 1996 - University of Twente, Enschede, Netherlands Duration: 28 Nov 1996 → 28 Nov 1996

Conference

Conference	IEEE/LEOS Symposium Benelux Chapter 1996
Country/Territory	Netherlands
City	Enschede
Period	28/11/96 → 28/11/96

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ArticleFinal published version, 203 KB

2 Other contribution
1 Conference contribution

Coherent imaging of guided fields
Balistreri, M. L. M. & van Hulst, N. F., 10 Oct 1997, Leiden
Research output: Other contribution › Other research output
Coherent imaging of guided fields
Balistreri, M. L. M. & van Hulst, N. F., 11 Jun 1997, Best Western Dish Hotel Enschede
Research output: Other contribution › Other research output
Coherent imaging of guided fields
Balistreri, M. L. M. & van Hulst, N. F., 12 Dec 1996, Nederlandse Vereniging voor Microscopie Jaarboek 1996 including the proceedings of the Joint Meeting of the BVM and NVvM 1996. Leiden: Karstens Drukkers, p. 113-113 1 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Cite this

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title = "Coherent imaging of guided fields",

abstract = "A photon scanning tunneling I atomic force microscope will be developed to measure the field distribution (amplitude, phase and time) in integrated optical devices. The microscope will be applied on real devices like splitters, converters, multiplexers, etc.",

author = "Marcello Balistreri and {van Hulst}, Niek",

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language = "English",

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T1 - Coherent imaging of guided fields

AU - Balistreri, Marcello

AU - van Hulst, Niek

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N2 - A photon scanning tunneling I atomic force microscope will be developed to measure the field distribution (amplitude, phase and time) in integrated optical devices. The microscope will be applied on real devices like splitters, converters, multiplexers, etc.

AB - A photon scanning tunneling I atomic force microscope will be developed to measure the field distribution (amplitude, phase and time) in integrated optical devices. The microscope will be applied on real devices like splitters, converters, multiplexers, etc.

M3 - Conference contribution

SN - 90-365-0920-5

SP - 218

EP - 221

BT - 1996 IEEE/LEOS Symposium Benelux Chapter

A2 - Driessen, A.

A2 - de Ridder, R.M.

PB - University of Twente, MESA Research Institute

CY - Enschede

T2 - IEEE/LEOS Symposium Benelux Chapter 1996

Y2 - 28 November 1996 through 28 November 1996

ER -

Coherent imaging of guided fields

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