Coherent imaging of guided fields

Marcello Balistreri, Niek van Hulst

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A photon scanning tunneling I atomic force microscope will be developed to measure the field distribution (amplitude, phase and time) in integrated optical devices. The microscope will be applied on real devices like splitters, converters, multiplexers, etc.
Original languageEnglish
Title of host publication1996 IEEE/LEOS Symposium Benelux Chapter
EditorsA. Driessen, R.M. de Ridder
Place of PublicationEnschede
PublisherUniversity of Twente, MESA Research Institute
Number of pages4
ISBN (Print)90-365-0920-5
Publication statusPublished - 28 Nov 1996
EventIEEE/LEOS Symposium Benelux Chapter 1996 - University of Twente, Enschede, Netherlands
Duration: 28 Nov 199628 Nov 1996


ConferenceIEEE/LEOS Symposium Benelux Chapter 1996

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