Coherent imaging of guided fields

Marcello Balistreri, Niek van Hulst

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

10 Downloads (Pure)

Abstract

A photon scanning tunneling I atomic force microscope will be developed to measure the field distribution (amplitude, phase and time) in integrated optical devices. The microscope will be applied on real devices like splitters, converters, multiplexers, etc.
Original languageEnglish
Title of host publication1996 IEEE/LEOS Symposium Benelux Chapter
EditorsA. Driessen, R.M. de Ridder
Place of PublicationEnschede
PublisherUniversity of Twente, MESA Research Institute
Pages218-221
Number of pages4
ISBN (Print)90-365-0920-5
Publication statusPublished - 28 Nov 1996
EventIEEE/LEOS Symposium Benelux Chapter 1996 - University of Twente, Enschede, Netherlands
Duration: 28 Nov 199628 Nov 1996

Conference

ConferenceIEEE/LEOS Symposium Benelux Chapter 1996
CountryNetherlands
CityEnschede
Period28/11/9628/11/96

Fingerprint Dive into the research topics of 'Coherent imaging of guided fields'. Together they form a unique fingerprint.

Cite this