Abstract
A photon scanning tunneling I atomic force microscope will be developed to measure the field distribution (amplitude, phase and time) in integrated optical devices. The microscope will be applied on real devices like splitters, converters, multiplexers, etc.
| Original language | English |
|---|---|
| Title of host publication | 1996 IEEE/LEOS Symposium Benelux Chapter |
| Editors | A. Driessen, R.M. de Ridder |
| Place of Publication | Enschede |
| Publisher | University of Twente, MESA Research Institute |
| Pages | 218-221 |
| Number of pages | 4 |
| ISBN (Print) | 90-365-0920-5 |
| Publication status | Published - 28 Nov 1996 |
| Event | IEEE/LEOS Symposium Benelux Chapter 1996 - University of Twente, Enschede, Netherlands Duration: 28 Nov 1996 → 28 Nov 1996 |
Conference
| Conference | IEEE/LEOS Symposium Benelux Chapter 1996 |
|---|---|
| Country/Territory | Netherlands |
| City | Enschede |
| Period | 28/11/96 → 28/11/96 |