Abstract
Magnetoresistance behavior of La0.60 Y0.07CaMnOx thin films epitaxially grown on LaAlO3 has been investigated. The films exhibit colossal magnetoresistance with the MR ratio in excess of 108% at ∼60K, H = 7T, which is the highest ever reported for thin film manganites. The partial substitution of La3+ ions with much smaller Y3+ ions results in more than an order of magnitude improvement in MR as compared to the undoped La-Ca-Mn-O material, both in bulk and thin film form. The La-Y-Ca-Mn-O films exhibit a strong dependence of magneto-resistance on film thickness with the maximum MR occurring at a film thickness of ∼1000Å.
Original language | English |
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Pages (from-to) | 4692-4694 |
Number of pages | 3 |
Journal | IEEE transactions on magnetics |
Volume | 32 |
Issue number | 5 PART 2 |
DOIs | |
Publication status | Published - 1 Dec 1996 |
Externally published | Yes |