Combined I(V) and dI(V)/dz scanning tunneling spectroscopy

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Abstract

We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.

Original languageEnglish
Article number075013
Number of pages6
JournalAIP advances
Volume8
Issue number7
DOIs
Publication statusPublished - 13 Jul 2018

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scanning tunneling microscopy
scanning
spectroscopy
tunnels
topography
amplifiers
microscopes
electric potential

Cite this

@article{99867b648b884302a7d46bf20f242623,
title = "Combined I(V) and dI(V)/dz scanning tunneling spectroscopy",
abstract = "We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.",
author = "Carolien Castenmiller and {Van Bremen}, Rik and Kai Sotthewes and Siekman, {Martin H.} and Zandvliet, {Harold J.W.}",
year = "2018",
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language = "English",
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journal = "AIP advances",
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publisher = "American Institute of Physics",
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T1 - Combined I(V) and dI(V)/dz scanning tunneling spectroscopy

AU - Castenmiller, Carolien

AU - Van Bremen, Rik

AU - Sotthewes, Kai

AU - Siekman, Martin H.

AU - Zandvliet, Harold J.W.

PY - 2018/7/13

Y1 - 2018/7/13

N2 - We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.

AB - We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.

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DO - 10.1063/1.5034422

M3 - Article

VL - 8

JO - AIP advances

JF - AIP advances

SN - 2158-3226

IS - 7

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