Combined I(V) and dI(V)/dz scanning tunneling spectroscopy

Carolien Castenmiller; Rik Van Bremen; Kai Sotthewes; Martin H. Siekman; Harold J.W. Zandvliet

doi:10.1063/1.5034422

Combined I(V) and dI(V)/dz scanning tunneling spectroscopy

Carolien Castenmiller^*, Rik Van Bremen, Kai Sotthewes, Martin H. Siekman, Harold J.W. Zandvliet (Corresponding Author)

^*Corresponding author for this work

Physics of Interfaces and Nanomaterials

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Abstract

We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.

Original language	English
Article number	075013
Number of pages	6
Journal	AIP advances
Volume	8
Issue number	7
DOIs	https://doi.org/10.1063/1.5034422
Publication status	Published - 13 Jul 2018

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10.1063/1.5034422Licence: CC BY

Castenmiller2018CombinedFinal published version, 258 KBLicence: CC BY

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abstract = "We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.",

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AU - Castenmiller, Carolien

AU - Van Bremen, Rik

AU - Sotthewes, Kai

AU - Siekman, Martin H.

AU - Zandvliet, Harold J.W.

PY - 2018/7/13

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N2 - We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.

AB - We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.

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Combined I(V) and dI(V)/dz scanning tunneling spectroscopy

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