Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes

M.H.P. Moers, M.H.P. Moers, R.G. Tack, O.F.J. Noordman, O.F.J. Noordman, Franciscus B. Segerink, N.F. van Hulst, B. Bölger, B. Bölger

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

34 Downloads (Pure)
Original languageUndefined
Title of host publicationNear Field Optics
EditorsDieter W. Pohl, Daniel Courjon
Place of PublicationDeventer
PublisherKluwer Academic Publishers
Pages79-86
Number of pages8
ISBN (Print)9780792323945
Publication statusPublished - 1993

Publication series

Name
PublisherKluwer Academic Publishers

Keywords

  • IR-25142
  • METIS-129943

Cite this

Moers, M. H. P., Moers, M. H. P., Tack, R. G., Noordman, O. F. J., Noordman, O. F. J., Segerink, F. B., ... Bölger, B. (1993). Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes. In D. W. Pohl, & D. Courjon (Eds.), Near Field Optics (pp. 79-86). Deventer: Kluwer Academic Publishers.
Moers, M.H.P. ; Moers, M.H.P. ; Tack, R.G. ; Noordman, O.F.J. ; Noordman, O.F.J. ; Segerink, Franciscus B. ; van Hulst, N.F. ; Bölger, B. ; Bölger, B. / Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes. Near Field Optics. editor / Dieter W. Pohl ; Daniel Courjon. Deventer : Kluwer Academic Publishers, 1993. pp. 79-86
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keywords = "IR-25142, METIS-129943",
author = "M.H.P. Moers and M.H.P. Moers and R.G. Tack and O.F.J. Noordman and O.F.J. Noordman and Segerink, {Franciscus B.} and {van Hulst}, N.F. and B. B{\"o}lger and B. B{\"o}lger",
year = "1993",
language = "Undefined",
isbn = "9780792323945",
publisher = "Kluwer Academic Publishers",
pages = "79--86",
editor = "Pohl, {Dieter W.} and Daniel Courjon",
booktitle = "Near Field Optics",
address = "Netherlands",

}

Moers, MHP, Moers, MHP, Tack, RG, Noordman, OFJ, Noordman, OFJ, Segerink, FB, van Hulst, NF, Bölger, B & Bölger, B 1993, Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes. in DW Pohl & D Courjon (eds), Near Field Optics. Kluwer Academic Publishers, Deventer, pp. 79-86.

Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes. / Moers, M.H.P.; Moers, M.H.P.; Tack, R.G.; Noordman, O.F.J.; Noordman, O.F.J.; Segerink, Franciscus B.; van Hulst, N.F.; Bölger, B.; Bölger, B.

Near Field Optics. ed. / Dieter W. Pohl; Daniel Courjon. Deventer : Kluwer Academic Publishers, 1993. p. 79-86.

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

TY - CHAP

T1 - Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes

AU - Moers, M.H.P.

AU - Moers, M.H.P.

AU - Tack, R.G.

AU - Noordman, O.F.J.

AU - Noordman, O.F.J.

AU - Segerink, Franciscus B.

AU - van Hulst, N.F.

AU - Bölger, B.

AU - Bölger, B.

PY - 1993

Y1 - 1993

KW - IR-25142

KW - METIS-129943

M3 - Chapter

SN - 9780792323945

SP - 79

EP - 86

BT - Near Field Optics

A2 - Pohl, Dieter W.

A2 - Courjon, Daniel

PB - Kluwer Academic Publishers

CY - Deventer

ER -

Moers MHP, Moers MHP, Tack RG, Noordman OFJ, Noordman OFJ, Segerink FB et al. Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes. In Pohl DW, Courjon D, editors, Near Field Optics. Deventer: Kluwer Academic Publishers. 1993. p. 79-86