Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes

M.H.P. Moers, R.G. Tack, O.F.J. Noordman, F.B. Segerink, N.F. van Hulst, B. Bölger

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic

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