Combining AFM with Ellipsometry; a Novel, Facile Aperture-less SNOM Setup for Nanoscale Studies

Peter Manfred Schön

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 27 Jul 2009

Keywords

  • METIS-260080

Cite this

@conference{00740646eb444b61b00beca5e62e9210,
title = "Combining AFM with Ellipsometry; a Novel, Facile Aperture-less SNOM Setup for Nanoscale Studies",
keywords = "METIS-260080",
author = "Sch{\"o}n, {Peter Manfred}",
year = "2009",
month = "7",
day = "27",
language = "Undefined",
pages = "--",

}

Combining AFM with Ellipsometry; a Novel, Facile Aperture-less SNOM Setup for Nanoscale Studies. / Schön, Peter Manfred.

2009. -.

Research output: Contribution to conferencePosterOther research output

TY - CONF

T1 - Combining AFM with Ellipsometry; a Novel, Facile Aperture-less SNOM Setup for Nanoscale Studies

AU - Schön, Peter Manfred

PY - 2009/7/27

Y1 - 2009/7/27

KW - METIS-260080

M3 - Poster

SP - -

ER -