Combining AFM with Ellipsometry; a Novel, Facile Aperture-less SNOM Setup for Nanoscale Studies

Peter Manfred Schön

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 27 Jul 2009
Event	Seeing the Nanoscale VII - Santa Barbara, USA Duration: 27 Jul 2009 → 1 Aug 2009

Keywords

@conference{00740646eb444b61b00beca5e62e9210,

title = "Combining AFM with Ellipsometry; a Novel, Facile Aperture-less SNOM Setup for Nanoscale Studies",

keywords = "METIS-260080",

author = "Sch{\"o}n, {Peter Manfred}",

year = "2009",

month = jul,

day = "27",

language = "Undefined",

pages = "--",

note = "Seeing the Nanoscale VII ; Conference date: 27-07-2009 Through 01-08-2009",

}