Combining AFM with Ellipsometry; a Novel, Facile Aperture-less SNOM Setup for Nanoscale Studies

Peter Manfred Schön

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 27 Jul 2009
EventSeeing the Nanoscale VII - Santa Barbara, USA
Duration: 27 Jul 20091 Aug 2009

Conference

ConferenceSeeing the Nanoscale VII
CitySanta Barbara, USA
Period27/07/091/08/09

Keywords

  • METIS-260080

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