Combining high level system design and testing

R.J.W.T. Tangelder, M.A.T. Sanduleanu, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 2nd IEEE International Mixed Signal Testing (IMSTW'96)
    Place of PublicationQuebec City, Canada
    Publication statusPublished - 15 May 1996


    • METIS-112954

    Cite this