Compact Structural Test Generation for Analog Macros

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    Abstract

    A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IV-converter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test set
    Original languageUndefined
    Title of host publicationProceedings of the European Design and Test Conference
    Place of PublicationParis France
    PublisherIEEE
    Pages581-589
    Number of pages9
    DOIs
    Publication statusPublished - 1 Mar 1997
    EventEuropean Design and Test Conference, ED&TC 1997 - Paris, France
    Duration: 17 Mar 199720 Mar 1997

    Publication series

    Name
    PublisherIEEE

    Other

    OtherEuropean Design and Test Conference, ED&TC 1997
    Period17/03/9720/03/97
    Other17-20 March 1997

    Keywords

    • METIS-112939
    • IR-16055

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